On-track monitoring method for space single event latchup effect

A single-event locking and spatial technology, which is applied in the direction of protection that responds to overcurrent, can solve the problems that parasitic transistors cannot maintain conduction, cannot cause protection circuit actions, and bias voltage drops.

Inactive Publication Date: 2014-04-02
LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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Problems solved by technology

However, there is also a phenomenon called "single particle micro-locking" in SEL, that is, after high-energy particles incident on the chip lead to the conduction of the parasitic transistor, the instantaneous increase of the circuit cu

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  • On-track monitoring method for space single event latchup effect
  • On-track monitoring method for space single event latchup effect

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[0018] The specific implementation of the present invention will be further described below in conjunction with the accompanying drawings and examples. The following examples are only used to illustrate the technical solutions of the present invention more clearly, but not to limit the protection scope of the present invention.

[0019] like figure 1 As shown, the technical solution implemented in the present invention is: a method for on-orbit monitoring of spatial single event lock-in effect, which is based on precision resistors, overcurrent detection circuits, counting latches, locking protection switch circuits, power systems, gatekeepers Dog counting circuit; the watchdog counting circuit is divided into two stages, the precision resistor is connected with the overcurrent detection circuit, and the overcurrent detection circuit is also connected with the counting latch and the lock protection switch circuit, the The locking protection switch circuit is also connected wit...

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Abstract

The invention belongs to the technical field of space radiation effect and strengthening, and particularly relates to an on-track monitoring method for space single event latchup effect. The method is based on a precision resistor, an over-current detection circuit, a counting latch, a latchup protection switching circuit, a power system and a watch dog counting circuit, wherein the watch dog counting circuit comprises two stages; the precision resistor is connected with the over-current detection circuit; the over-current detection circuit is also connected with the counting latch and the latchup protection switching circuit; the latchup protection switching circuit is also connected with the watch dog counting circuit and the power system. The monitoring method can realize space single event latchup effect monitoring of different track environment, and simultaneously provides a quick and accurate universality method for monitoring and evaluating deep space detection single event latchup effect.

Description

technical field [0001] The invention belongs to the technical field of space radiation effects and reinforcement, and in particular relates to an on-orbit monitoring method for space single-event locking effects. Background technique [0002] The single event effect caused by the interaction between a single charged particle in space and electronic devices is one of the main factors affecting the safe operation of spacecraft in orbit. CMOS devices are widely used in spacecraft electronic systems because of their low power consumption and low noise interference. However, the single event lock-in effect caused by a single high-energy particle in a CMOS device can cause permanent damage to the hardware in a very short period of time, leading to the failure of the spacecraft's electronic system and seriously affecting the spacecraft's on-orbit life. [0003] With the continuous development of semiconductor process technology, the integration of electronic devices is getting hig...

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Application Information

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IPC IPC(8): H02H3/08
Inventor 安恒薛玉雄杨生胜把得东汤道坦马亚莉柳青曹洲
Owner LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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