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Wiring member, its manufacturing method, and manufacturing method of wiring member bonded body

A technology of wiring components and manufacturing methods, applied in the direction of manufacturing tools, conductors, welding media, etc., can solve problems such as corrosion of seals, adverse effects of long-term reliability, etc.

Inactive Publication Date: 2017-06-09
RESONAC CORPORATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, flux tends to corrode the sealant (EVA: ethylene-vinyl acetate) used in the solar cell module manufacturing process for laminated solar cells, which tends to adversely affect long-term reliability

Method used

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  • Wiring member, its manufacturing method, and manufacturing method of wiring member bonded body
  • Wiring member, its manufacturing method, and manufacturing method of wiring member bonded body
  • Wiring member, its manufacturing method, and manufacturing method of wiring member bonded body

Examples

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Embodiment

[0137] Hereinafter, although an Example demonstrates this invention concretely, this invention is not limited to these Examples. In addition, unless otherwise specified, "part" and "%" are based on mass. In addition, the average thickness of the conductive material and the wiring member was measured with a micrometer at five locations, and the arithmetic mean thereof was obtained.

[0138]

[0139] (manufacturing of conductive parts)

[0140] As the conductive material, Cu material (purity: 99.99%) was rolled to produce a rectangular linear conductive material with a width of 1.5 mm and an average thickness of 0.2 mm.

[0141] (Preparation of non-eutectic solder material)

[0142] Figure 7 An outline of a hot-dip plating facility 21 as an apparatus for manufacturing the wiring member of the present invention is shown. The composition of the solder alloy of the coated conductive member of the wiring member of the present invention can be changed by adding to Figure 7 T...

Embodiment 2

[0166] In Example 1, the composition of the solder alloy used in the production of the wiring member was changed from 10 parts of tin and 90 parts of lead to 20 parts of tin and 80 parts of lead, and a solder coating layer containing a non-eutectic solder material was produced and formed. The wiring member 2 was used, and it carried out similarly to Example 1, and evaluated the adhesiveness at each bonding temperature. In addition, as a result of examining the cooling curve of the non-eutectic solder material of the wiring member 2 obtained, the liquidus temperature was 280°C and the solidus temperature was 183°C. The results are shown in Table 1.

Embodiment 3

[0168] In Example 1, the composition of the solder alloy used in the production of the wiring member was changed from 10 parts of tin and 90 parts of lead to 30 parts of tin and 70 parts of lead, and a solder coating layer containing a non-eutectic solder material was produced and formed. In the same manner as in Example 1 except that the wiring member 3 was used, the evaluation of the adhesiveness at each bonding temperature was performed. In addition, as a result of examining the cooling curve of the non-eutectic solder material of the wiring member 3 obtained, the liquidus temperature was 255°C and the solidus temperature was 183°C. The results are shown in Table 1.

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Abstract

The present invention provides a wiring member including: a conductive material; and a solder coating layer disposed on at least a partial area of ​​a surface of the conductive material and containing a non-eutectic solder material.

Description

technical field [0001] The present invention relates to a wiring member, its manufacturing method, and a manufacturing method of a wiring member bonded body. Background technique [0002] use figure 1 The structure of the solar cell will be described. figure 1 It is a perspective view showing one embodiment of the structure of a solar cell. Such as figure 1 As shown, the solar cell 200 includes: a surface electrode (surface finger electrode) 103 for extracting electric power generated by the semiconductor substrate 101 (polycrystalline and single crystal Si units), a back electrode 106, and a surface electrode 106 for collecting the electric power generated by the surface electrode 103. The front electrode (bus electrode) 105 for collecting electric power, and the back electrode (bus electrode) 107 for collecting the electric power taken out by the back electrode 106 . In addition, the wiring member 102 is bonded to the front electrode 105 and the back electrode 107 by s...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B23K1/00B23K35/26B23K35/14C22C9/00C22C11/06C22C12/00C22C13/00C22C13/02H01L31/05
CPCC22C9/00B23K1/0008B23K35/0238B23K35/025B23K35/262B23K35/264B23K35/268B23K2101/38B23K2101/40C22C11/06C22C12/00C22C13/00C22C13/02H01L31/0512H01L2924/0002Y02E10/50H01L2924/00
Inventor 栗原祥晃吉田诚人野尻刚仓田靖足立修一郎加藤隆彦
Owner RESONAC CORPORATION