Sensitive area-oriented embedded software test case generating method

Abstract

The invention relates to a sensitive area-oriented embedded software test case generating method. The sensitive area-oriented embedded software test case generating method comprises the steps that firstly, binary files are analyzed, intermediary language transformation is conducted on an assembly language generated by the disassembling technology, and instrumentation is conducted on transformation results so as to obtain an instrumentation procedure; secondly, the instrumentation procedure is used for analyzing a sensitive area so as to determine taint data; thirdly, a seed test case dynamic execution procedure is used for collecting branch path constraint conditions, and when a branch jump occurs, constraint sets collected at present are reversed and output; finally, whether each constraint in the collected constraint sets comprises taints is analyzed, processing is carried out, the simplified constraint sets are sent into a constraint solver and are solved, and obtained final results are test cases which can generate input controllable branch paths covering the taint data. Compared with the single static analysis technology or the single dynamic analysis technology, the sensitive area-oriented embedded software test case generating method has higher analysis efficiency.

Description

technical field [0001] The invention belongs to the technical field of software testing, and relates to a method for generating embedded software test cases for sensitive areas. Background technique [0002] Nowadays, embedded software has a huge market share in all walks of life. Medicine, education, banking, military, computer and other fields are deeply affected by embedded systems. However, due to the limited memory capacity of embedded software, high real-time requirements , Strong specificity, poor inheritance and other characteristics make embedded software largely limited in terms of space and time resources under limited conditions. At the same time, because embedded software has relatively high requirements for reliability and security, Therefore, higher requirements are put forward for embedded defect detection. It has become a hot field of embedded software research to carry out security detection for embedded software, find out the loopholes in the software in ...

AI Technical Summary

Problems solved by technology

Since the binary code is the final embodiment of the software, the software release will inevitably have a binary executable program, even if it is released as a source code, it can be compiled into a binary executable program, which has a wide range of practicability. The disadvantage is that the binary program lacks a low-level structure. information

Binary analysis tools such as Rose also provide the function of static analysis of binary code, but its analysis ability is weak, and there are big problems in accuracy.

[0010] However, both of these two analysis techniques have certain limitations, which are mainly reflected in: the static analysis technique only analyzes the structure of the program, and does not actually run the program, so the collected constraints cannot fully match the entire path. coverage; although the dynamic analysis technology can collect more comprehensive constraints, but because the collected constraints are not further processed, the collected constraints are too large, resulting in excessive constraint solving overhead and low solution accuracy. Insufficient high

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