Method for measuring curved surface temperature through infrared microscope
A technology for measuring curved surfaces and microscopes, which is applied in the field of image processing, can solve problems such as inaccurate temperature, unclear local positions of infrared images, etc., and achieve the effect of precise measurement
Inactive Publication Date: 2014-04-30
SHANGHAI UNIV
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[0005] The purpose of the present invention is to provide a method for measuring the temperature of a curved surface using an infrared microscope, which solves the problem in the prior art that the local position of the infrared image is not clear and the temperature is inaccurate caused by the excessive fluctuation of the surface of the measured object, and realizes the multi-focus position image The fusion of infrared images makes almost all positions of the infrared image in a clear state, and then achieves accurate measurement of surface temperature
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[0022] The present invention is described in further detail below in conjunction with embodiment.
[0023] Such as figure 1 and figure 2 As shown, a method for measuring surface temperature using an infrared microscope has the following steps:
[0024] 1) Put the U disk circuit board embedded with the chip into the observation area of the infrared microscope;
[0025] 2) Through the step-length controllable automatic lifting system, move the infrared microscope lens from top to bottom (or bottom to top) so that the highest (or lowest) position of the circuit board is in the focus position;
[0026] 3) Use the infrared CCD in the infrared microscope system to obtain the infrared image of the test piece at this focal position;
[0027] 4) Through the step length controllable automatic lifting system, the step length is set according to the depth of field of the infrared microscope lens, so that the infrared microscope lens moves periodically in the vertical direction to co...
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The invention discloses a method for measuring curved surface temperature through an infrared microscope. The method comprises steps of (1) putting areas to be measured of a piece to be measured on an observation desk under a lens of the infrared microscope; (2) moving the lens of the infrared microscope to enable the highest position or the lowest position of the piece to be measured to be positioned at focusing positions of the lens of the infrared microscope; (3) acquiring infrared images of the piece to be measured at the focusing positions through an infrared charge coupled device (CCD) in an infrared microscope system; (4) collecting infrared images at different focus positions by setting step lengths according to depths of field of the lens of the infrared microscope; (5) fusing the infrared images at different focus positions into an infrared image where all the positions are in clear focusing state through a multi-focus image fusion system; (6) acquiring temperature information corresponding to the infrared image according to the fused infrared image to achieve precise measurement of the curved surface temperature. The method is applicable to any curved surfaces with projections in the vertical direction non-overlapped or nearly non-overlapped.
Description
technical field [0001] The invention relates to the field of image processing, in particular to a method for measuring the temperature of a curved surface using an infrared microscope. Background technique [0002] The infrared microscope integrates the microscopic magnification function of the visible light microscope and the temperature measurement function of the infrared thermal imager. It is mainly used for the measurement of the temperature of a small area and the detection of infrared characteristics. , scientific research and other aspects have a wide range of applications. [0003] At present, an infrared microscope collects an infrared image of a focal plane, and uses the image information to obtain temperature information. The clarity of the infrared image affects the accuracy of the temperature. When the surface fluctuation of the measured object is within the depth of field of the microscope lens, clear infrared images of the object can be obtained at all posit...
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IPC IPC(8): G01J5/10
Inventor胡志宇刘中意张春董建敏肖丹萍
OwnerSHANGHAI UNIV