Back-end detection method of diode and triode
A detection method and triode technology, applied in the direction of single semiconductor device testing, etc., can solve problems such as inability to adapt to large-scale production, irregularity and system, etc., and achieve the effects of good test consistency, increased normal rate, and large detection range.
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[0026] The technical solution of the present invention will be further described in detail below in conjunction with the accompanying drawings, but the protection scope of the present invention is not limited to the following description.
[0027] like figure 1 As shown, the back-end detection method of diodes and triodes is mainly used for the packaging and testing of diodes and triodes to ensure the consistency of the test process. It includes a one-window test and a two-window test, wherein the one-window test includes the following steps :
[0028] S11: Send the product to be tested into a window test socket;
[0029] S12: The product to be tested is tested for potential hazards in a window test socket. Potential hazard tests include reverse breakdown test, high current gain test, large saturation current test and high current open test;
[0030] S13: The product to be tested is subjected to a non-hazardous test in a one-window test socket. The non-hazardous test include...
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