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Repair algorithm for image artifact caused by scintillator defects in micro-CT

A technology of scintillator and defective pixels, which is applied in the field of image artifact repair algorithm to achieve the effect of reducing repair times, saving time and improving accuracy

Active Publication Date: 2014-05-07
TIANJIN UNIV
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Regarding the research on image artifact correction caused by scintillator defects in micro-CT, no relevant reports have been found in the literature at home and abroad

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  • Repair algorithm for image artifact caused by scintillator defects in micro-CT
  • Repair algorithm for image artifact caused by scintillator defects in micro-CT
  • Repair algorithm for image artifact caused by scintillator defects in micro-CT

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Embodiment Construction

[0026] The purpose of the present invention is to provide a repair algorithm for image artifacts caused by scintillator defects in micro-CT. Based on the BSCB algorithm in digital image restoration technology, this algorithm combines the actual imaging characteristics of micro-CT to propose an improved BSCB (IBSCB) algorithm. The algorithm is applied to the artifact restoration of micro-CT images, and the image quality is significantly improved after restoration.

[0027] (1) Use micro-CT imaging equipment to collect background projection images (empty scan images);

[0028] (2) Artifact extraction is performed on the image obtained in step (1) to obtain a mask image that marks the artifact area;

[0029] (3) Use micro-CT imaging equipment to collect sample images;

[0030] (4) Perform uneven illumination correction on the image collected in step (3);

[0031] (5) According to the artifact area marked in step (2), repair the corresponding area in the sample image obtained i...

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Abstract

The invention relates to a micro-CT (Computed Tomography) and aims to improve the image quality by repairing an image artifact caused by scintillator defects in the micro-CT. Therefore, the technical scheme adopted in the invention is that a repair algorithm for an image artifact caused by scintillator defects in micro-CT comprises the following steps: (1) acquiring a background projection image, namely, a blank scanning image; (2) obtaining a mask image of which an artifact region is marked out; (3) using micro-CT imaging equipment to acquire a sample image; (4) carrying out non-uniform illumination correction; (5) repairing a corresponding region of the sample image; (6) diffusing a corresponding region of the sample image acquired in step (4); and (7) alternately performing the repairing process in step (5) and the diffusion process in step (6), and repeating the process until a set number of times reaches. The repair algorithm of the invention is mainly used for micro-CT image processing.

Description

technical field [0001] The invention relates to a micro-CT (Computed Tomography, computerized tomography) image artifact restoration algorithm, in particular to a micro-CT image artifact restoration algorithm caused by scintillator defects. Background technique [0002] Micro-CT plays an increasingly important role in MEMS device packaging and assembly error analysis, semiconductor device packaging and internal defect detection, and petroleum geological exploration. How to improve the imaging quality of micro-CT has always been a hot topic in the field of CT imaging. [0003] The scintillator is the core device of the micro-CT imaging system. Affected by factors such as temperature, air, and water vapor, defects such as cracks, coloring, clouds, and inclusions will occur during the growth and packaging of scintillators. These defects affect the light output characteristics and uniformity, thereby affecting the imaging quality. Because the pixel size of the flat-panel dete...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/00
Inventor 邹晶胡晓东须颖陈津平吴瑶瑶胡小唐
Owner TIANJIN UNIV
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