Unlock instant, AI-driven research and patent intelligence for your innovation.

Harmonic ratio based defect classifier

A defect classification and defect technology, applied in the storage field, can solve problems such as low performance, inaccurate actions, and data corruption

Active Publication Date: 2014-05-28
AVAGO TECH INT SALES PTE LTD
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Defects in the carrier medium caused by imprecise action, poor performance, or data corruption

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Harmonic ratio based defect classifier
  • Harmonic ratio based defect classifier
  • Harmonic ratio based defect classifier

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0011] A detailed description will now be given based on the drawings of the disclosed embodiments.

[0012] Figure 1A to Figure 3 Embodiments of systems and methods for detecting and classifying at least one media defect are illustrated. Including, but not limited to: thermal asperity (TA) and delaminated (DLM) defects are known to occur in carrier media (such as hard drives and other permanent or semi-permanent storage devices). The term "carrier medium" is used to refer to any carrier medium on which a system or method operates in an embodiment.

[0013] Figure 1A is an embodiment of a system 100 for detecting and classifying at least one defect of at least one test medium 102 . System 100 includes computing system 104 in communication with assay medium 102 . The computing system 104 includes any combination of hardware, software, or firmware configured to perform one or more of the steps described herein for detecting and classifying at least one defect in the test me...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The disclosure is directed to a system and method for detecting and classifying at least one media defect. A periodic pattern is written to a medium to yield at least one waveform. The magnitude of the waveform is compared against a defect threshold to detect the presence or absence of media defects in the medium. When at least one defect is detected, a magnitude for each of at least two harmonics of the waveform is determined in the defect range. The defect is classified by comparing a ratio of the magnitudes of the at least two harmonics against a classification threshold.

Description

technical field [0001] The invention relates to the field of storage technology, in particular to a defect classifier based on harmonic ratio. Background technique [0002] Data can be stored on several types of carrier media, such as hard drives, optical discs, and other forms of permanent or semi-permanent memory. Defects in the carrier medium result from imprecise motion, poor performance, or data corruption. Testing for media defects can improve the reliability of data storage systems. Contents of the invention [0003] One embodiment of the present disclosure is a method of detecting and classifying at least one media defect. A periodic pattern is written into the medium to obtain at least one waveform. The amplitude of the waveform is compared to a defect threshold to detect the presence or absence of a media defect in the media. When at least one defect is detected, the magnitude of each of at least two harmonics of the waveform is determined within the defect r...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G11B20/18G11C29/04
CPCG11B20/182G11B2220/2516G01R23/02G01R31/3183G11B27/36
Inventor 斯科特·M·德齐亚克明·金乔纳森·戴克惠斯
Owner AVAGO TECH INT SALES PTE LTD