Combined overhead conductor defect detection method

An overhead wire and joint detection technology, which is applied in the direction of measuring devices, material analysis through optical means, instruments, etc., can solve the problems that wires are difficult to realize

Active Publication Date: 2014-06-04
YUN NAN ELECTRIC TEST & RES INST GRP CO LTD ELECTRIC INST +1
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  • Abstract
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Problems solved by technology

[0002] Since the overhead wires are located on high-altitude towers, the conventional detection method for overhead wires is usually to conduct infrared thermal imaging detection or infrared temperature measurement detection on the wires during operation to determine whether there is a local overheating phenomenon in the wires, but it is difficult for the wires after overheating. Enables diagnosis of defect conditions

Method used

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Embodiment Construction

[0019] A joint detection method for overhead wire defects, the present invention is characterized by:

[0020] 1) Thermal infrared image collection: At the same observation point, use an infrared thermal imager to observe the overhead wires to obtain thermal infrared images;

[0021] 2) Lidar surveying and mapping: use lidar surveying and mapping equipment to survey and map the overhead wire to obtain surveying and mapping data and images;

[0022] 3) Determine the location coordinates of the wire defect: compare the thermal infrared image with the surveying and mapping image, and determine the GPS location coordinates of the abnormal temperature point on the overhead wire in the thermal infrared image on the surveying image;

[0023] 4) X-ray digital imaging detection: X-ray digital imaging detection equipment is used to detect the wire at the coordinate point, and the defect of the wire at this position is judged by the detection result.

[0024] The thermal infrared image acquisition...

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Abstract

The invention discloses a combined overhead conductor defect detection method. The method comprises the following steps: acquiring a thermal infrared image, namely observing an overhead conductor at the same observation point by utilizing a thermal infrared imager; performing laser radar plotting, namely plotting the overhead conductor by utilizing laser radar plotting equipment, and acquiring plotting data and a plotting image; determining coordinates of the defect positions of the conductor, namely comparing the thermal infrared image with the plotting image, and determining corresponding global position system (GPS) position coordinates of temperature abnormality points on the overhead conductor in the thermal infrared image on the plotting image; and performing X-ray digital imaging detection. A combined detection method of the thermal infrared imaging technology, laser radar plotting technology and X-ray digital detection technology is utilized, so that defect detection of the overhead conductor is realized. Compared with a traditional detection method, the method has the advantages that the defects of the overhead conductor can be effectively detected, and the defects are judged and evaluated.

Description

Technical field [0001] The invention relates to a combined detection method for overhead wire defects, in particular to a combined detection method for overhead wire defects using infrared thermal imaging, laser radar mapping and X-ray digital imaging detection. Background technique [0002] Because the overhead wire is on the high-altitude tower, the conventional inspection method for overhead wire is usually to perform infrared thermal imaging detection or infrared temperature measurement on the wire during operation to determine whether the wire has a local over-temperature phenomenon, but it is difficult for the wire after the over-temperature Realize the diagnosis of defects. [0003] In view of the above-mentioned problems, the present invention adopts a method combining infrared thermal imaging, lidar mapping and X-ray digital imaging detection technology to realize defect detection of overhead wires. [0004] Infrared thermal imaging is to use infrared detectors and optical ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/3563G01N21/17G01N23/04
Inventor 王进吴章勤孙成刚李志翔郑欣刘荣海于虹
Owner YUN NAN ELECTRIC TEST & RES INST GRP CO LTD ELECTRIC INST
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