2results about How to "Easy defect detection" patented technology

The application provides a measuring device, and relates to the technical field of optical detection.The measuring device comprises a support assembly, an auxiliary assembly and a detection mechanism.The support assembly comprises a first support frame and a second support frame arranged oppositely; the auxiliary assembly is arranged on the first support frame; at least one avoiding hole is arranged on a fixed plate in the auxiliary assembly; when a contact is placed on the fixed plate, and a weak boundary area of the contact is arranged opposite to the avoiding hole; the detection mechanism comprises an upper light source assembly, a lower light source and a visual detection assembly; the upper light source assembly and the visual detection assembly are arranged on the second support frame; the upper light source assembly is arranged between the auxiliary assembly and the visual detection assembly; the lower light source is arranged on the first support frame and below the fixed plate; and the light of the lower light source can irradiate to the weak boundary area of the contact through the avoiding hole.The measuring device can improve the image definition when detecting the defects of the contacts of Bluetooth earphones, thereby improving the reliability of the detection result.

This invention discloses a machine vision-based laser chip surface defect detection device, comprising a chip conveying system, an image acquisition system, and a chip acquisition platform. The chip conveying system transports a waffle box containing chips to the chip acquisition platform. The image acquisition system acquires images of each chip individually. The chip acquisition platform inspects the chips and classifies defective and non-defective chips accordingly. This invention achieves automated surface defect detection of laser chips and filters out defective chips.