Solid laser service life testing device

A life test device and solid-state laser technology, which is applied in the direction of optical instrument testing, measuring device, machine/structural component testing, etc., can solve the problems of developing and reporting life test instruments without solid-state lasers, and achieve simple structure and good application prospects , easy-to-operate effects

Active Publication Date: 2014-08-13
FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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Problems solved by technology

[0005] There is no life evaluation test for solid-state lasers in the world, and there is no corresponding report on the development of life test instruments for solid-state lasers. In order to evaluate the life of solid-state lasers, it is necessary to develop a set of life test devices that meet the application. important question

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Embodiment Construction

[0013] The present invention will be further described below in conjunction with the embodiments and drawings, but the implementation of the present invention is not limited thereto.

[0014] For a solid-state laser that uses optical parametric oscillation to achieve mid-infrared laser output with a wide tuning range, its main structure usually includes a pump source module (using a 793nm semiconductor laser pump source), a laser module (2μm solid-state laser), an OPO module (3 ~5μm optical parametric oscillator) three main modules, the life of the solid-state laser is closely related to the life of these three modules. The optical power of each module is used to evaluate the lifetime of solid-state lasers. At the same time, in order to realize the function of accelerated life test, the test device is required to have the function of controlling the temperature of the three modules. The solid-state laser lifetime testing device of the present invention will be described in de...

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Abstract

The invention provides a solid laser service life testing device which comprises a first temperature control device used for controlling the temperature of a pumping source module of a solid laser, a second temperature control device used for controlling a laser module of the solid laser, a third temperature control device used for controlling an OPO module of the solid laser, a first reflecting mirror arranged between the pumping source module and the laser module, a second reflecting mirror arranged between the laser module and the OPO module, a first power meter used for monitoring the reflected light power of the first reflecting mirror, a second power meter used for monitoring the reflected light power of the second reflecting mirror, a third power meter used for monitoring the output power of the OPO module and temperature adjusting equipment for adjusting the first temperature control device, the second temperature control device and the third temperature control device. Accelerated life tests can be carried out on the solid laser, and the testing device is simple in structure and easy to operate and has great application prospect.

Description

technical field [0001] The invention relates to the field of optical technology, in particular to a solid-state laser life test device. Background technique [0002] The 3-5μm band is not only the atmospheric infrared window with the smallest attenuation, but also covers the absorption peaks of many atoms and molecules in this band. Therefore, lasers in this band are very important in many fields such as spectroscopy, remote sensing, medical treatment, and environmental protection. application value and prospects. This makes the research on the 3-5μm band laser become a very hot topic in the world at present. [0003] In terms of the output of solid-state mid-infrared lasers, optical parametric oscillation (OPO) technology is currently mainly used, using KNbO 3 , LiNbO 3 , KTP, KTA, AgGaS 2 , AgGaSe 2 , PPLN, ZnGeP 2 Isocrystal effectively achieves laser output in the mid-infrared band through OPO technology. Mid-infrared laser output power from 1W level AgGaSe in the...

Claims

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Application Information

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IPC IPC(8): G01M11/00
Inventor 路国光谢少锋郝明明赖灿雄黄云恩云飞
Owner FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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