Neuron model displacement or deformation monitoring method of electric transducer embedded with microcomputer

A micro-electromechanical sensor, deformation monitoring technology, applied in instruments, measuring devices, etc., can solve the problems of poor durability, large number of measuring points, and high cost

Active Publication Date: 2014-10-15
TONGJI UNIV
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Problems solved by technology

Among these test methods, the mechanical method is the traditional test method, which is not suitable for long-term measurement in the field. It is usually only suitable for short-term manual measurement, and the test accuracy is low; while the optical test method has high test accuracy, but it is affected by the environment such as light. The impact is obvious, and the installation and operation are complicated and expensive, which is usually only suitable for short-term measurement; while the electronic test method is currently a method that can be used for long-term and field measurement. Installed, sealed and replaced to improve

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  • Neuron model displacement or deformation monitoring method of electric transducer embedded with microcomputer
  • Neuron model displacement or deformation monitoring method of electric transducer embedded with microcomputer
  • Neuron model displacement or deformation monitoring method of electric transducer embedded with microcomputer

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Embodiment Construction

[0024] The idea, specific structure and technical effects of the present invention will be further described below in conjunction with the accompanying drawings, so as to fully understand the purpose, features and effects of the present invention.

[0025] Such as figure 1 , figure 2 As shown, a rigid rod with an acceleration sensor is used as a basic structural unit, which is similar to a neuron unit; when several basic structural units are connected in series, they are tightly fixed with the test object to form a line shape similar to the test object; The first node is used as the datum, through the measurement results of the rotation angle of the rigid member and the displacement of the node (such as image 3 As shown), the displacement of adjacent and extended structural units on the entire chain can be obtained; with the help of the computer chip on the unit or unit group (this embodiment uses the existing micro-electromechanical acceleration sensor to achieve, the adja...

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Abstract

The invention relates to a displacement test method which is suitable for static and dynamic displacement measurement of a structure of scale in a long line range or a space range. The neuron model displacement or deformation monitoring method of an electric transducer embedded with a microcomputer is characterized in that a multi-point neuron structure model, the transducer as a neuron body and a supplement rigid rod as a neuron myelin are connected to form a neuron basic unit assembly; a number of neuron assemblies are connected in series to form a nerve chain; and a start node is used as a benchmark to acquire the relative displacement of each unit to determine the attached structure deformation. Compared with the prior art, the structure deformation and dynamic characteristic measuring method provided by the invention can overcome the limits of traditional mechanical temporary test and optical test method environment impacts and high cost price, and is especially suitable for large range or long scale and multi-point long-term monitoring, such as longitudinal and transverse deformation measurement and real-time monitoring of a building, a bridge, a tunnel, a dam, a slope and other structures.

Description

technical field [0001] The invention relates to a displacement test method, which is suitable for the static and dynamic displacement measurement of structures in the long-line range or space range, and is especially suitable for the longitudinal and lateral spatial deformation of structures such as buildings, bridges, tunnels, dams and slopes. Measurement and real-time monitoring. Background technique [0002] At present, there are many methods for measuring the displacement or deformation of structures, including displacement sensors, acceleration sensors, optical fibers, and even optical instruments such as infrared and laser. According to the classification principle, it can be divided into three categories: optical, electronic and mechanical. Among these test methods, the mechanical method is the traditional test method, which is not suitable for long-term measurement in the field. It is usually only suitable for short-term manual measurement, and the test accuracy is ...

Claims

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Application Information

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IPC IPC(8): G01B21/32G01B21/02
Inventor 李方元
Owner TONGJI UNIV
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