Efficient analyzing method for superfine line structure object electromagnetic property
A technology of electromagnetic characteristics and analysis methods, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as poor grid quality
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[0057] The technical solution of the present invention will be described in detail below in conjunction with the accompanying drawings. Examples of analyzing radiation and scattering of open curved thin-wire structured objects of different configurations are given to illustrate the advantages of the invention.
[0058] Several key steps in the present invention are as follows:
[0059] step one:
[0060] The electromagnetic analysis of an ideal electric conductor with a general open and curved thin-wire structure can be achieved by solving the following electric field integral equation:
[0061] ∫ c I ( r ′ ) G 1 ( r , r ′ ) ds ′ = jωϵ s ^ ...
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