Automatic testing method and system of aging characteristics of crystal oscillator

A technology of crystal oscillator and aging characteristics, applied in the direction of instruments, measuring electronics, measuring devices, etc., can solve the problems of long manual test time span, low test efficiency, large test error, etc., to reduce manpower input, improve measurement efficiency, Effect of reducing measurement error

Active Publication Date: 2014-12-10
GUANGDONG DAPU TELECOM TECH CO LTD
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Problems solved by technology

[0005] The purpose of the present invention is to propose an automatic testing method and system for the aging characteristics of crystal oscillators, which can solve the problems of long time span, large testing error and low testing efficiency in existing manual testing

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  • Automatic testing method and system of aging characteristics of crystal oscillator
  • Automatic testing method and system of aging characteristics of crystal oscillator
  • Automatic testing method and system of aging characteristics of crystal oscillator

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Embodiment Construction

[0050] The following is a clear and complete description of the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0051] combine figure 1 A first embodiment of the present invention will be described.

[0052] figure 1It is a flow chart of an automatic test method for the aging characteristics of a crystal oscillator in the first embodiment of the present invention. The automatic test method for the aging characteristics of a crystal oscillator in the first embodiment of the present invention can be performed by an automatic test system for the aging characteristics of a cryst...

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Abstract

The invention discloses an automatic testing method and system of aging characteristics of a crystal oscillator. The method comprises starting a crystal oscillation measuring unit according to configured aging characteristic measuring parameters; according to preset frequency collecting time intervals, generating frequency collecting signals and transmitting the frequency collecting signals to the crystal oscillation measuring unit to collects frequencies of a crystal oscillator to be tested at corresponding time points; receiving the frequencies of the crystal oscillator to be tested at the corresponding time points, which are fed back by the crystal oscillation measuring unit; when determining that the aging characteristic testing of the crystal oscillator to be tested is completed, performing data processing on the received frequencies to obtain the aging characteristics of the crystal oscillator to be tested. The automatic testing method of the aging characteristics of the crystal oscillator enables the aging characteristic testing process of the crystal oscillator to be completed automatically and has the technical advantages of reducing the labor investment, reducing the measuring errors and greatly improving the measuring efficiency.

Description

technical field [0001] The invention relates to the field of automatic testing, in particular to an automatic testing method and system for aging characteristics of crystal oscillators. Background technique [0002] Crystal oscillator (crystal oscillator) is a high-precision, high-stability oscillator, which is widely used in various oscillation circuits such as color TVs, computers, and remote controls. During the use and storage of the crystal oscillator, the frequency will change with time, mainly due to the shedding of the attachment on the wafer surface, the external force caused by the wafer during the grinding process, the gas adsorbed on the surface of the crystal oscillator, and the electrodes caused by air leakage. It is caused by factors such as surface changes, which are mainly reflected in the daily aging rate and annual aging rate. The daily aging rate includes index parameters such as frequency drift, frequency stability, aging curve trend and shaking. The an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
Inventor 李坤然
Owner GUANGDONG DAPU TELECOM TECH CO LTD
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