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Phase measuring profilometry system nonlinear correction method combining geometric calibration

A phase measurement profile and nonlinear correction technology, which is applied in the field of optical three-dimensional sensing, can solve the problems of low execution efficiency, nonlinear correction schemes cannot be combined with geometric calibration, and low correction accuracy, so as to improve efficiency and simplify nonlinear correction The process of improving the effect of calibration accuracy

Active Publication Date: 2014-12-24
SICHUAN UNIV
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Problems solved by technology

[0003] The purpose of the present invention is to propose a non-linear correction method combined with geometric calibration, which is easy to operate, in view of the shortcomings of the current structured light system nonlinear correction scheme that cannot be organically combined with geometric calibration, low execution efficiency, and low calibration accuracy. Can achieve high calibration accuracy and execution efficiency

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Embodiment Construction

[0009] The present invention will be described in further detail below in conjunction with the accompanying drawings and working principles.

[0010] The device used has a CASIO XJ-M140 projector, and the projector buffer frame size is pixels, the gray quantization level is 8bit, the maximum output frequency of the projector is 150 frames / s; 1 Prosilica GC650 industrial camera, the resolution is pixels, the grayscale quantization level is 8bit, and the maximum capture frequency of the camera is 62 frames / s; a three-dimensional target for geometric calibration of the camera and projector. 1 computer with Core i3 3530 CPU and 4GB memory, the computer controls the structured light projection and shooting process. attached figure 1 It is a flow chart of the nonlinear correction method in this embodiment. The specific implementation steps of this example are as follows:

[0011] (1) Scan the three-dimensional target with the sinusoidal structured light pattern of the fundamen...

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Abstract

The invention discloses a phase measuring profilometry system nonlinear correction method combining geometric calibration. According to the phase measuring profilometry system nonlinear correction method combining geometric calibration, a target is scanned through the phase measuring profilometry to obtain an accurate phase, average brightness and brightness modulation, the accurate phase and the average brightness are utilized to calibrate a protector and a camera shooting device respectively, nonlinear response of the projector is obtained according to the accurate phase and a shot structured light image to establish a gray level lookup table, the gray value of the image is pre-compensated by utilizing the gray level lookup table before three-dimensional scanning is carried out on the projected structured light image, and therefore the purpose of carrying out nonlinear correction on a measurement system is achieved. The phase measuring profilometry system nonlinear correction method combining geometric calibration can be used for geometric calibration and nonlinear correction of the phase measuring profilometry system, organically combines geometric calibration of the measurement system and nonlinear correction, and has the advantages of convenient operation, high correction accuracy and high execution efficiency.

Description

technical field [0001] The invention relates to optical three-dimensional sensing technology, in particular to a nonlinear correction method of a structured light three-dimensional measurement system. Background technique [0002] Phase measuring profilometry (PMP) is a widely used non-contact optical three-dimensional measurement technology, which has the advantages of high precision and high reliability. In practical applications, when there are fewer projection patterns, the nonlinearity of the camera-projector system will cause serious phase errors. On the other hand, the real-time nature of 3D scanning requires that the number of projection patterns be as small as possible. Zhongwei Li et al. introduced the phase A method for geometric calibration and nonlinearity correction of survey profilometry. Among them, the nonlinear correction method first projects a 4-step phase-shifted sinusoidal structured light pattern to a uniform plane, obtains the distorted phase affect...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
Inventor 刘凯龙云飞郑晓军吴炜杨晓敏
Owner SICHUAN UNIV
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