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Four-line test probe device and application method thereof

A technology for testing probes and fixing seats, which is applied in the direction of measuring devices, measuring electricity, and measuring electrical variables, etc. It can solve problems such as scrapped printed circuit boards, difficult control of printed circuit board pressure, scratches on printed circuit boards, etc., and achieves saving human effect

Active Publication Date: 2014-12-24
HANS CNC SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, due to the fast movement speed, it is difficult to control the pressure exerted by the test probe device on the printed circuit board. After the test probe contacts the printed circuit board, the contact force is too large, resulting in scratches or dents on the printed circuit board, resulting in printed circuit board Circuit board scrap

Method used

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  • Four-line test probe device and application method thereof
  • Four-line test probe device and application method thereof
  • Four-line test probe device and application method thereof

Examples

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Embodiment Construction

[0032] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. Preferred embodiments of the invention are shown in the accompanying drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thorough and comprehensive.

[0033] It should be noted that when an element is referred to as being “fixed” to another element, it can be directly on the other element or there can also be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and similar expressions are used herein for purposes of ill...

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Abstract

The invention relates to a four-line test probe device. The four-line test probe device comprises a traction mechanism, a body fixing base, two test probes and a photoelectric sensor. The two test probes are arranged on the two sides of the body fixing base respectively and respectively comprise an elastic support and a probe head arranged on the elastic support, and the elastic support of one test probe is provided with a protruding light-shielding block. The side, close to the test probe with the light-shielding block, of the photoelectric sensor is provided with a notch, and the photoelectric sensor has catadioptric light emitted from one side of the notch to the other side of the notch. The elastic supports deform in the testing process so that the amount of the catadioptric light shielded by the light-shielding block can be changed, and a changed output voltage is generated through the photoelectric sensor so as to control the pressure on a printed circuit board from the test probes. The four-line test probe device has the advantage that the contact force between the four-line test probe device and the printed circuit board can be effectively controlled. The invention further provides an application method of the four-line test probe device.

Description

technical field [0001] The invention relates to a printed circuit board (PCB) test device, in particular to a four-wire test probe device and an application method thereof. Background technique [0002] The probe testing device is generally used for testing a printed circuit board (PCB). During testing, a test probe needs to be in contact with the circuit board. According to different test methods, there are two kinds of test probe devices, two-wire and four-wire. The four-wire test probe device is used in occasions where the accuracy of the resistance value is not high, and the four-wire test probe device is used in the low-resistance test occasion where the resistance value is required to be high. [0003] During the test of the traditional four-wire test probe device, the probe usually lowers and lifts the needle at a speed of 10 to 50 times per second to contact different test points. For reliable testing, the probes need to be securely attached to the test board. At ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/073
Inventor 谭艳萍王星翟学涛杨朝辉高云峰
Owner HANS CNC SCI & TECH
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