Thin-film solar cells with porous high-resistance layers

Abstract

The invention relates to a high-resistance thin film applied to a thin-film solar cell and the thin-film solar cell of a novel structure. According to the thin-film solar cell of the novel structure, the porous high-resistance thin film is additionally arranged at a light incidence front electrode of the thin-film solar cell. As the porous high-resistance thin film (hereinafter referred to as the high-resistance thin film) is additionally arranged between semiconductor materials and front electricity-conducting electrode materials, the high-resistance thin film can effectively resist electric leakage channels, and low-resistance channels for transmitting photon-generated carriers are retained.

Description

technical field [0001] The invention belongs to the field of preparation of solar photovoltaic devices, in particular to a new-structure thin-film solar cell with a porous high-resistance thin film. Background technique [0002] Generally speaking, the structure of thin-film solar cells mainly includes the following parts: transparent conductive layer (as the front electrode of the battery), N-type semiconductor layer (also called window layer), P-type semiconductor layer (absorption layer) and battery back electrode layer (positive terminal), such as figure 1 shown. As the window layer where sunlight is incident, the N-type semiconductor film is usually very thin to minimize the absorption loss of short-wavelength light in this film. The thinner the film of the window layer, the more prone to defects such as holes and discontinuities in the film, so that the transparent conductive layer and the absorbing layer, that is, the P-type semiconductor layer, are in direct contac...

AI Technical Summary

Problems solved by technology

However, the addition of a high-resistance film also hinders the normal transport of photogenerated carriers, resulting in a corresponding increase in the series resistance of the battery, which is not conducive to the improvement of device performance.

Images