Blind element detection method and device of infrared focal plane array
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- 凯迈(洛阳)测控有限公司
- Publication Date
- 2018-03-23
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Abstract
Description
technical field
[0001] The invention relates to a blind element detection method and device of an infrared focal plane array. Background technique
[0002] Affected by factors such as materials and manufacturing processes at the present stage, invalid pixels generally exist in infrared focal plane array detectors, and these invalid pixels are also called blind pixels. If no corresponding processing is performed during imaging, blind pixels will cause bright or dark spots to appear in the corresponding positions of the infrared image, which will seriously affect the quality of infrared imaging. Therefore, compensation for blind pixels is not possible in infrared imaging. a missing link. However, the premise and foundation of blind pixel compensation is to be able to detect blind pixels effectively. Therefore, an efficient blind pixel detection method is of great significance for improving the quality of infrared imaging.
[0003] At present, it is a common method to detect ...