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image electron spin analyzer

An electron spin and analyzer technology, applied in the direction of circuits, discharge tubes, electrical components, etc., to increase the number of channels, reduce aberrations, and avoid geometric configuration difficulties

Active Publication Date: 2017-04-19
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Since this measurement method needs to magnetize the sample, it can only measure ferromagnetic samples

Method used

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Embodiment Construction

[0027] The implementation of the present invention will be illustrated by specific specific examples below, and those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification.

[0028] see Figure 2 to Figure 3 . It should be noted that the structures, proportions, sizes, etc. shown in the drawings attached to this specification are only used to match the content disclosed in the specification, for those who are familiar with this technology to understand and read, and are not used to limit the implementation of the present invention. Limiting conditions, so there is no technical substantive meaning, any modification of structure, change of proportional relationship or adjustment of size, without affecting the effect and purpose of the present invention, should still fall within the scope of the present invention. within the scope covered by the disclosed technical content. At the same ti...

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Abstract

The invention provides an image type electron spin analyzer. The image-type electron spin analyzer includes at least: a scattering target, a two-dimensional image-type electron detector, and an electron bending unit; wherein, the electron bending unit is used to focus the incident electrons and bend them at a first angle to The optimal incident angle is focused on the scattering target, and the outgoing electrons scattered by the scattering target are focused and bent at a second angle, then focused and emitted to the two-dimensional image type electron detector at the optimal outgoing angle, and the trajectory of the incident electron is consistent with the The trajectory of the outgoing electrons is separated, and at least one of the first angle and the second angle is not 00; thus, the first two-dimensional imaging from the electron image at the initial plane of the electron spin analyzer to the target plane and from the target plane can be realized respectively. The second two-dimensional imaging to the plane of the two-dimensional image-type electron detector can realize the multi-channel measurement of the electron spin; and the introduction of the electron bending unit can increase the degree of freedom of the geometric configuration of each component of the spin analyzer.

Description

technical field [0001] The invention relates to the field of electron spin analysis, in particular to an image type electron spin analyzer. Background technique [0002] At present, the devices for measuring electron spin mainly include Mott detectors, Spin-LEED detectors, and VLEED detectors. Among them, the measurement method of the Mott detector is: first accelerate the electrons to a kinetic energy of 20-100KeV, and then make the electrons scatter on a high-Z element target with high spin-orbit interaction, and measure the incident by measuring the asymmetry of the intensity of the scattered electrons. The spin of the electron; the Spin-LEED detector measures the spin of the electron by measuring the asymmetry of the intensity of the diffraction spot of the electron on the W(100) single crystal surface; the VLEED detector is a newly developed new measurement device, and its measurement method It is: first accelerate (decelerate) the kinetic energy of the electrons to 6e...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01T1/32
CPCH01J37/252H01J37/244H01J2237/24557H01J2237/2544H01J37/147H01J37/29
Inventor 乔山万维实季福昊
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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