Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for Measuring the Micron-Scale Depth of Dimples in Components

A measurement component, micron-level technology, used in measurement devices, instruments, optical devices, etc., can solve the problems of slow detection speed, inconvenient operation, high cost, improve accuracy and traceability, and solve unmeasurable blind spots. , without the effect of damaging hidden dangers

Active Publication Date: 2017-03-01
CHONGQING MATERIALS RES INST
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, there are mechanical instruments and stylus instruments for measuring tiny depth dimensions, but these instruments and equipment need to be purchased separately, which increases the cost, complex structure, inconvenient operation, slow detection speed, and low measurement accuracy of existing measuring instruments

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for Measuring the Micron-Scale Depth of Dimples in Components
  • Method for Measuring the Micron-Scale Depth of Dimples in Components

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment 2

[0037] The characteristics of this embodiment are: according to step 1 and step 2, the depth of part of the concave notch on the standard depth sample block and the corresponding focusing scale difference J 2 -J 1， Step 3. Count the depth of each concave notch on some standard depth samples and the corresponding focusing scale difference J 2 -J 1 , made into the standard depth block scale as shown in Table 2;

[0038] Refer to Table 2 for the scale of standard depth samples

[0039] Focus scale difference / mm 2 3 5 8 Depth / μm 5 8 12 20

[0040] In step 4, the pit reference plane of the part to be tested is placed on the metallographic microscope 1, and by adjusting the focus knob 2 of the metallographic microscope 1, when the arc outline of the pit reference plane is clear, record the focus knob Focus scale J 1 , and then adjust the focus knob 2 of the metallographic microscope 1 again, when the bottom contour of the pit is as clear as the arc co...

specific Embodiment 3

[0042] The characteristics of this embodiment are: the focusing scale J of the focusing knob 2 1 、J 2 Using manual input into the computer, the metallographic microscope 1 measures the horizontal distance h of the concave notch through its own ruler, and manually inputs it into the computer 3 for storage. Other features are the same as those of the specific embodiment 1 and the specific embodiment 2.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for measuring micron-order depths of pits of a component. The method comprises the following steps: firstly, manufacturing a standard depth sample block with a plurality of pits with different micron-order depths; secondly, measuring the depths of the pits by using a microscope, and recording focusing scale differences J2-J1 corresponding to a focusing knob of the microscope to make a standard depth sample block scale reference table: by amplifying the microscope multiple, measuring the horizontal distances h of planes, namely depths of reference planes of the pits, measuring till arc contours of the pits are clear in the reference planes and recording focusing scales J1, measuring again till bottom contours and the arc contours of the pits are equally clear and recording focusing scales J2, and obtaining the focusing scale differences J2-J1; finally, by comparing with the standard depth sample block scale reference table, finding out the depths of the pits of the component to be measured. The method is easy to operate; by the method, various tiny depths can be measured to a micron-order precision and the accuracy and the traceability of data are improved.

Description

technical field [0001] The invention relates to a measuring method, in particular to a tiny depth measuring method, which is especially suitable for corrosion test and morphology research. Background technique [0002] With the rapid development of science and technology and the continuous deepening of scientific experiments and research, the assembly accuracy of equipment components is getting higher and higher. Due to corrosion pits or cracks in the metal parts of equipment during processing or storage, the corrosion pits or Cracks will affect the assembly accuracy, so it is necessary to study the surface morphology of metal parts in corrosion tests, and to detect the depth of tiny corrosion pits and tiny cracks. At present, there are mechanical instruments and stylus instruments for measuring micro-depth dimensions, but these instruments and equipment need to be purchased separately, which increases the cost, complex equipment structure, inconvenient operation, slow detec...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/22
Inventor 王春光万红尤艳飞赵安中刘海定王明波刘微
Owner CHONGQING MATERIALS RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com