Microsatellite multifunctional data testing system

Abstract

The invention provides a novel microsatellite multifunctional data testing system. A satellite data testing device comprises an ASIC chip, an Ethernet communication module, a USB communication module, a power module, an RS422 / RS485 serial port communication module, a wireless communication module, a 1-WIRE communication module, a CAN bus communication module and an RS232 communication module, wherein the Ethernet communication module, the USB communication module, the power module, the RS422 / RS485 serial port communication module, the wireless communication module, the 1-WIRE communication module, the CAN bus communication module and the RS232 communication module are connected with the ASIC chip. A satellite testing data display system conducts data interaction with the satellite data testing device through an RS232 serial port and an Ethernet port or a USB port capable of being arranged, and data analysis, display and drawing are conducted through the satellite testing data display system. Various collected satellite data can be encoded and decoded through hardware of the data testing device and converted into data in formats capable of being identified by the satellite testing data display system, and therefore the satellite testing data display system can be used for conducting comprehensive system testing on tested satellites.

Description

technical field [0001] The invention relates to the field of testing, in particular to a microsatellite multifunctional data testing system. Background technique [0002] The stand-alone satellites are developed by different stand-alone manufacturers, and their interfaces and data formats are different, which results in the diversity of satellite test equipment. Testers often need multiple sets of test equipment to complete the overall test of the satellite. At the same time, the test cycle is often relatively long. long, which results in an increase in the satellite development cycle. The new microsatellite adopts a more mature electronic product design, with high electronic integration on each stand-alone unit, and faster data transmission speed on the data interface of each stand-alone unit. Due to the high requirements for the development cost of microsatellites, higher requirements are put forward for the testing technology and means of microsatellites. [0003] Due t...

AI Technical Summary

Problems solved by technology

[0003] Due to technical limitations, traditional satellite testing often takes a lot of time, which makes it difficult to reduce the overall cost of satellites. In view of the high degree of comprehensive electronic integration of micro-satellites, satellite testing technology also needs to develop in the direction of high integration and simplify the test interface. , Unify the test format, so as to simplify the test process, shorten the test cycle, and reduce the overall development cost

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