Memory device testing method and system

Abstract

The invention discloses a memory device testing method and system. The memory device testing method comprises the following steps: numbering blocks of a to-be-tested memory device; randomly selecting a number as a binary tree root node; calculating a probability that nodes in each layer of a binary tree are all built according to a preset random algorithm; building a binary tree by using numbers of the blocks as numbers of nodes in each layer of the binary tree according to the probability that the nodes in each layer are all built; testing a block corresponding to the number of each node newly built by the binary tree; when a failure of one block of the to-be-tested memory device is tested, reminding that the test fails, and stopping building the binary tree; when the blocks corresponding to the numbers of the newly built nodes all pass through the test, reminding that the test succeeds. According to the memory device testing method, the binary tree is built by using the numbers of the blocks as the nodes, and the blocks corresponding to the nodes are tested, so that the blocks of the memory device are uniformly sampled for being tested, and thus a manner that a plenty time needs to be consumed for testing the memory device conventionally is changed.

Description

technical field [0001] The invention relates to a storage device testing method and system. Background technique [0002] At present, storage devices, such as memory and hard disk, need to be tested when the manufacturer ships. For example, if a server has a 16GB memory, it takes about 25 minutes to test. If a factory produces a thousand pieces of servers, then It takes about 139 days to do the memory test, which takes a lot of time. Contents of the invention [0003] In view of the above, it is necessary to provide a storage device testing method and system. [0004] The storage device testing method includes: numbering the blocks of the storage device to be tested; randomly selecting a number from the above-mentioned numbers as the root node of the binary tree; calculating the probability that all nodes of the above-mentioned binary tree are constructed according to a preset random algorithm, so The above-mentioned preset random algorithm makes the probability that the...

AI Technical Summary

Problems solved by technology

[0002] At present, storage devices, such as memory and hard disk, need to be tested when the manufacturer ships. For example, if a server has a 16GB memory, it takes about 25 minutes to test. If a factory produces a thousand pieces of servers, then It takes about 139 days to do the memory test, which takes a lot of time

Images