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System and method for detecting test instrument

A test instrument, detection and testing technology, applied in transmission systems, transmission monitoring, electrical components, etc., can solve the problems of inability to realize batch testing of test instruments, save time and effort, and achieve the effect of reducing time consumption and simple detection methods.

Active Publication Date: 2015-05-13
OPWILL TECH BEIJING
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The main problem to be solved by this application is to provide a system and method for testing test instruments, so as to solve the unrealizable batch testing of test instruments, save time and effort, improve work efficiency, reduce the time consumed by switching test environments back and forth, and Technical problems of testing related performance of test instruments

Method used

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  • System and method for detecting test instrument

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0070] Such as figure 1 As shown, it is a system for detecting and testing instruments according to the present invention, including: an environment creation unit 101, a data processing unit 102, a data transmission unit 103, a data storage unit 104 and an intelligent terminal 105, wherein,

[0071] The environment creation unit 101 is used to create different test environments and detect test instruments;

[0072] The data processing unit 102 is configured to receive the detection result from the environment creation unit 101, and convert the detection result into data;

[0073] The data transmission unit 103 is configured to transmit the data converted by the data processing unit 102 to the data storage unit 104 and the smart terminal 105;

[0074] The data storage unit 104 is configured to store the data converted by the data processing unit 102;

[0075] The smart terminal 105 is configured to analyze the data converted by the data processing unit 102 .

[0076] Prefera...

Embodiment 2

[0084] Such as figure 1 As shown, it is another system for detecting test instruments according to the present invention, including: an environment creation unit 101, a data processing unit 102, a data transmission unit 103, a data storage unit 104 and an intelligent terminal 105, wherein,

[0085] The environment creation unit 101 is used to create different test environments and detect test instruments;

[0086] The data processing unit 102 is configured to receive the detection result from the environment creation unit 101, and convert the detection result into data;

[0087] The data transmission unit 103 is configured to transmit the data converted by the data processing unit 102 to the data storage unit 104 and the smart terminal 105;

[0088] The data storage unit 104 is configured to store the data converted by the data processing unit 102;

[0089] The smart terminal 105 is configured to analyze the data converted by the data processing unit 102 .

[0090] Preferab...

Embodiment 3

[0108] Such as figure 1 As shown, it is another system for detecting and testing instruments according to the present invention, including: an environment creation unit, a data processing unit, a data transmission unit, a data storage unit and an intelligent terminal, wherein,

[0109] The environment creation unit 101 is used to create different test environments and detect test instruments;

[0110] The data processing unit 102 is configured to receive the detection result from the environment creation unit 101, and convert the detection result into data;

[0111] The data transmission unit 103 is used to transmit the data converted by the data processing unit 102 to the data storage unit and the smart terminal;

[0112] The data storage unit 104 is configured to store the data converted by the data processing unit 102;

[0113] The smart terminal 105 is configured to analyze the data converted by the data processing unit 102 .

[0114] Preferably, as Figure 4 As shown,...

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PUM

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Abstract

The invention discloses a system and a method for detecting a test instrument. The system comprises an environment establishment unit, a data processing unit, a data transmission unit, a data storage unit and an intelligent terminal. The method comprises the following steps: 1, the environment establishment unit establishes different test environments and detects the test instrument; 2, the data processing unit receives a detection result transmitted from the environment establishment unit and converts the detection result into data; 3, the data transmission unit transmits the data converted by the data processing unit to the data storage unit and the intelligent terminal; 4, the data storage unit stores the data converted by the data processing unit; 5, the intelligent terminal analyzes the data converted by the data processing unit. The technical problems, which cannot be realized in the prior art, of performing batch testing on the test instruments, saving time and labor, further improving the working efficiency, reducing the time consumed for switching the testing environments back and forth and detecting related performance of the test instruments are solved.

Description

technical field [0001] The invention relates to the field of communication testing, in particular to a system and method for detecting and testing instruments. Background technique [0002] At present, with the rapid development of communication network technology, in order to check whether the data transmission is complete and correct in the process of program execution, various data transmission measuring instruments have emerged as the times require. Taking optical testing instruments as an example, generally speaking, the following requirements are required , First, the sensitivity is high, which means that the tester has a high efficiency of converting optical power into current; second, the response speed is fast, that is, after the optical signal is injected, there will be an electrical signal output immediately; when the optical signal stops, the electrical signal Also stop output, don't delay. In this way, the incident signal can be reproduced; third, the noise is ...

Claims

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Application Information

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IPC IPC(8): H04B17/00
Inventor 朱天全鲍胜青韩丽娜
Owner OPWILL TECH BEIJING
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