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68results about How to "Implement batch testing" patented technology

A prediction method for crankshaft fatigue life based on genetic nerve network

The invention discloses a prediction method for crankshaft fatigue life based on a genetic nerve network, belongs to the field of crankshaft fatigue life testing of an internal combustion engine. The purpose of the method is to solve the deficiency of a DC resonant-type crankshaft fatigue life testing machine for possessing destructiveness to the crankshaft testing and having long testing time. The principle of the method is to normalize the historical data of the crankshaft testing by utilizing the conventional DC resonant-type crankshaft fatigue life testing machine to obtain a training sample set; to optimize a BP artificial nerve network model through genetic algorithm; to carry out iteration training to the genetic algorithm-based and optimized BP artificial nerve network by utilizing the training sample set to obtain a trained BP artificial nerve network prediction model; to use the prediction model to carry out rapid prediction for the crankshaft fatigue life. The method optimizes the BP artificial nerve network based on the genetic algorithm, avoids the "over fitting" problem of the single BP nerve network, improves the training speed and prediction precision effectively; rapidly predicts the crankshaft fatigue life in a short time without destroying the crankshaft quality, is capable of carrying out a batch testing for the crankshafts of a whole production batch.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY

Method and system of testing nodes in batches

The invention provides a method and system of testing nodes in batches. The method includes the following steps: obtaining a test script for testing multiple nodes; storing the obtained test script in a main node; accessing each slave node one by one through the main node so that the test script is copied in each slave node during access; and carrying out a command to make the test script run for the main node, logging in each slave node remotely one by one through the main node, and carrying out the command to make the test script run when each slave node is logged in. According to the scheme, nodes in batches can be tested, and the performance test efficiency is further improved.
Owner:LANGCHAO ELECTRONIC INFORMATION IND CO LTD

Machine learning-based tunnel rock quartz content test system and method

The invention provides a machine learning-based tunnel rock quartz content test system and method. The system comprises an information acquisition system and a learning system, wherein the informationacquisition system is borne on a mechanical arm, approaches to surrounding rocks along with the movement of the mechanical arm and is used for learning indoor rock sample images and rock sample images practically observed via well logging according to received acquired data, recognizing texture features of different rocks through a local binary pattern feature extraction algorithm so as to different differences of different rocks in the aspects of color, structure and construction, integrating feature amounts through a support vector machine algorithm, and establishing a response informationquartz content prediction model so as to calculate contents of quartz in front rocks in TBM tunneling projects.
Owner:SHANDONG UNIV

Anti-interference test method and system of wireless communication module

The invention discloses an anti-interference test method and system of a wireless communication module. The anti-interference test system comprises a test device and an interference source generating device. The test device and the interference source generating device are in communication connection with a communication module to be tested. The test device, when receiving a first test script, starts an interference-free test and obtains the first packet loss rate of the communication module to be tested under various test signal strengths. When the first packet loss rate is within a first preset range, the test device sends a second test script to the interference source generating device and starts an interference test. A first control unit acquires the second packet loss rate of the communication module to be tested under various interference signal strengths. When the second packet loss rate is within a second preset range, a second control unit generates a test result according to the current interference signal strength. The anti-interference test method and system achieve the automatic anti-interference test of the communication module, greatly reduce the work intensity of testers, can realize a batch test, and greatly improve efficiency.
Owner:CIG SHANGHAI

Solid insulation voltage resistance performance test system under high voltage and low temperature Paschen condition

InactiveCN102253319AMeet electrical performance testing requirementsImplement batch testingElectrical testingInsulation layerSuperconducting Coils
The invention discloses a solid insulation voltage resistance performance test system under a high voltage and low temperature Paschen condition. The solid insulation voltage resistance performance test system comprises a detection container and a substance to be tested, wherein the substance to be tested is suspended in the detection container; an insulation socket is arranged on the side face of the detection container; the substance to be tested comprises a metal tube; an insulation layer to be tested is coiled outside the metal tube; both ends of the metal tube are fixedly communicated with extension tubes with closed outer ends respectively; insulators are additionally arranged on the extension tubes respectively; insulation layers are additionally coiled on the extension tubes and the insulators respectively to form extension sections; the extension sections are led out of holes formed on the front end face and the rear end face of the detection container respectively; a temperature sensor is arranged on the insulation layer to be tested and an aluminum foil is wrapped on the insulation layer to be tested so as to form a grounding pole; and a measurement line of the temperature sensor and the aluminum foil grounding pole are lead out of the insulation socket. By the solid insulation voltage resistance performance test system, Paschen condition electric performance test of a solid insulation layer of a high voltage part of a large-size superconducting magnet can be realized; and the problems of a voltage resistance performance test method and a judgment measure of a high voltage insulation part working in a vacuum environment can be solved basically.
Owner:INST OF PLASMA PHYSICS CHINESE ACAD OF SCI

Thermal-protection material thermal prevention and insulation system, testing method and heat treatment method

The invention discloses a thermal-protection material thermal prevention and insulation system, a testing method and a heat treatment method. It can be achieved that a spacecraft thermal-protection material is closer to multi-state thermal prevention and insulation performance testing of a service environment. In the meanwhile, in the preparing process of the thermal-protection material, single-face heat treatment or sintering is conducted, the gradient temperature is formed in the thickness direction, the surface undergoes high temperature, service is stable at high temperature, while the inward temperature is gradually lowered, and both the mechanical property and the thermal insulation performance of the material are improved. As is tested, the overall mechanical property of the material can be improved by around 20%, and the heat conductivity can be lowered by 10% or above. Therefore, by means of the testing system, it can be achieved that the thermal-protection material is closerto the multi-state thermal prevention and insulation performance testing of the service environment, it can also be achieved that in the material preparing process, single-surface high-temperature quick heating is conducted, and the comprehensive performance of the thermal-protection material is improved.
Owner:AEROSPACE RES INST OF MATERIAL & PROCESSING TECH +1

Method for rapidly elevating reliability of SONOS (silicon-oxide-nitride-oxide-silicon) by measuring tunneling electric field

The invention discloses a method for rapidly elevating the reliability of SONOS (silicon-oxide-nitride-oxide-silicon) by measuring a tunneling electric field. The method comprises the steps of measuring relevant parameters of an operating voltage window and a tunneling electric field window of the SONOS; completing the ONO (oxide-nitride-oxide) filming of the SONOS to be tested, then measuring the tunneling electric field window; deducting the operating voltage window of the SONOS to be tested according to the tunneling electric field window and the relevant parameters of the SONOS to be tested; and elevating the properties of the data retention of the SONOS to be tested according to the operating voltage window of the SONOS to be tested. According to the method, an electronic / hole escape mechanism of the SONOS device and a principle corresponding to a measuring method of the tunneling electric field are utilized, a positive tunneling electric field and a negative tunneling electric field of an ONO film are measured, and the properties of the data retention of the SONOS device are judged, so that the technique process of the elevation of the reliability is simplified, the elevation time is shortened, and the batch test is facilitated.
Owner:SHANGHAI HUAHONG GRACE SEMICON MFG CORP

Station switching device of valve sealing performance test platform

The invention relates to a station switching device of a valve sealing performance test platform. The station switching device of the valve sealing performance test platform comprises a base, guide racks, a height adjusting cylinder, a base platform, a sliding pillar, a sliding platform, a position adjusting motor, a lead screw, a station switching motor and a pusher dog disk, wherein the guide racks are fixed to the top of the base, the sliding pillar is in sliding fit with the guide racks, the base platform is fixed to the upper half of the sliding pillar, the position adjusting motor is installed on the front portion of the base platform, the front end of the lead screw is connected with the position adjusting motor, the rear end of the lead screw is connected with the rear portion of the base platform, a transverse exhibition stand is arranged on the rear half of the sliding platform, the left side and the right side of the transverse exhibition stand are in sliding fit with the base platform, the lower portion of the transverse exhibition stand is in thread fit with the lead screw, the station switching motor is fixed to the upper portion of the sliding platform, and the pusher dog disk is installed on the station switching motor. The station switching device of the valve sealing performance test platform has the advantages of being reasonable in structural design and high in automation degree and can automatically switch stations and open and close valves in the process of valve sealing performance tests, manual operation is replaced, the labor intensity of workers is greatly reduced, and batch tests of the sealing performance of the hydraulic valves can be carried out easily.
Owner:广东安规检测有限公司

Testing equipment for radio frequency chip

The invention discloses testing equipment for a radio frequency chip, and belongs to the field of chip testing. A probe and at least two pressure sensors are arranged on a first surface, opposite to a second supporting plate, in a first supporting plate of the test equipment; a second surface, opposite to the first supporting plate, of the second supporting plate is provided with a chip groove used for placing a radio frequency chip, a pin of the radio frequency chip is opposite to the probe, and the pressure sensor is used for measuring a pressure value between the probe and the pin; when the probe makes contact with the pin for the first time and the pressure values measured by the at least two pressure sensors are equal, the probe is controlled to be away from the pin; when the probe makes contact with the pin for the second time and the pressure value reaches a target pressure value, the radio frequency chip is tested through the probe, and the target pressure value is the pressure value when the radio frequency chip can be tested and the probe and the radio frequency chip are not damaged. According to the invention, waste of human resources can be avoided, the probe and the radio frequency chip can be protected while the radio frequency chip is normally tested, and the service life of the test equipment and the radio frequency chip is prolonged.
Owner:南京燧锐科技有限公司

Method and system for automatically guiding server in batch testing

The invention provides a method and system for automatically guiding a server in batch testing. The method comprises the following steps that a mainboard BMC MAC address, an SN and an order number arescanned; a binding relation between mainboard BMC MAC address information and SN and order number information is established; during start-up testing, the mainboard BMC MAC address of the current server is read; according to the mainboard BMC MAC address of the current server and the binding relation established between the mainboard BMC MAC address information and the SN and order number information, the SN and order number of a machine are determined; according to the SN and the order number, the type of the current server is determined, and a testing program is downloaded. The binding relation between the mainboard BMC MAC address information and the SN and order number information is established, the testing program of the corresponding type is automatically acquired according to themainboard BMC MAC address information during start-up testing, batch testing of the server is achieved, and the problems are solved that during start-up testing of the server, an operator needs to manually input the SN and order number information, and automation cannot be achieved.
Owner:ZHENGZHOU YUNHAI INFORMATION TECH CO LTD

Probe card, preparation method and chip testing method

The embodiment of the invention discloses a probe card, a preparation method and a chip testing method. The probe card comprises a substrate and a patterned substrate layer located on one side of thesubstrate. The patterned substrate layer comprises at least one vacant groove and at least one cantilever probe located on the side, away from the substrate, of the patterned substrate layer. The cantilever probe extends to the vacant groove and is suspended on the vacant groove. The cantilever probe comprises a first thermal deformation layer, a second thermal deformation layer and a conductive contact. The first thermal deformation layer is located between the patterned substrate layer and the second thermal deformation layer, the thermal expansion coefficient of the first thermal deformation layer is larger than that of the second thermal deformation layer, the conductive contact is arranged at the end, suspended in the vacant groove, of the cantilever probe, the first thermal deformation layer and/or the second thermal deformation layer are/is a conductive layer, and the conductive layer is electrically connected with the conductive contact. The cantilever probe card solves the problems that an existing probe card is insufficient in butt joint precision and prone to poor contact, automatic contact of the probe is achieved, and effective contact between the cantilever probe anda chip to be detected can be guaranteed.
Owner:CHENGDU VISTAR OPTEOLECTRONICS CO LTD

Memory testing device and method

The invention provides a memory test device and a test method. The memory test device comprises a test control module and a test execution module, the test control module comprises a control chip anda first communication chip, and the control chip is in communication connection with the first communication chip; the test execution module comprises a second communication chip and a plurality of test execution groups, and the plurality of test execution groups are in communication connection with the second communication chip; the test execution group comprises a terminal capable of mounting atested memory; and the first communication chip is electrically connected with the second communication chip. Batch automatic testing can be carried out on the memory banks, the testing efficiency isgreatly improved, a C2 control chip is adopted in the testing control module, the structure is simple, a special control server is not needed, and the cost is saved.
Owner:SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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