2results about How to "Implement batch testing" patented technology

The application discloses a kind of power chip electrical performance testing device, comprising: device base, including base shell, collector metal structure and collector terminal;Pressing electrode, including pressing electrode shell, emitter terminal is equipped on the pressing electrode shell, emitter metal structure is equipped in the bottom of pressing electrode shell;The side of pressing electrode shell is equipped with gate terminal and grid stylus;Transmission cavity and button, pressing electrode shell is assembled in transmission cavity by pressure spring, transmission cavity is equipped with transmission gear, one side of transmission gear is engaged with button, and the other side is engaged with pressing electrode shell, transmission cavity bottom is connected with device base by rotating assembly, press button, pressing electrode is lifted while transmission cavity moves down, the transmission cavity is supported by rotating assembly, and the pressing and translation button rotate the pressing electrode to test station or waiting station.The present application can guarantee the crimping connection of power chip electrode, ensure the consistency of connection interface pressure, and improve the test efficiency.

This utility model discloses a batch testing device for motherboards, including a motherboard testing component. The motherboard testing component includes a mounting bracket, a top plate fixed to the top surface of the mounting bracket, support brackets fixed to both sides of the top plate, a cylinder mounted on the top surface of the support brackets, a piston rod connected to the output end of the cylinder, a long strip plate connected to the piston rod, a motherboard placement slot on the top surface of the top plate, and a circular hole within the motherboard placement slot. A connecting component includes a first sliding groove on the bottom surface of the long strip plate, a slider inserted into the first sliding groove, a second sliding groove on the bottom surface of the slider, a sliding strip inserted into the second sliding groove, and a first threaded hole on the slider. This utility model, through the cooperation of the motherboard testing component and the connecting component, achieves batch testing of motherboards during use. Furthermore, the power-on testing connection port can be adapted and adjusted according to different motherboard models, making it highly flexible in use.