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Storage equipment testing method and device, electronic equipment and storage medium

A storage device and testing method technology, applied in the computer field, can solve the problems of device performance test impact, storage device cable looseness, stress test error, etc., to achieve the effects of batch testing, shortening testing cycle, and improving testing efficiency

Inactive Publication Date: 2021-12-07
INSPUR SUZHOU INTELLIGENT TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] During the transportation of the storage device to the customer site, it is likely to cause loosening of the internal cables of the storage device. The loosening of the cable will cause bit errors in the link of the device, and errors will occur when the device is stress tested. The equipment sent to the customer's site needs to be deployed in the environment. The connection problem of the optical fiber line will cause the network transmission rate to not reach the rated value, which will affect the performance test of the equipment.

Method used

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  • Storage equipment testing method and device, electronic equipment and storage medium
  • Storage equipment testing method and device, electronic equipment and storage medium
  • Storage equipment testing method and device, electronic equipment and storage medium

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Embodiment Construction

[0051] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Apparently, the described embodiments are only some of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of this application. In addition, in the embodiments of the present application, "first", "second", etc. are used to distinguish similar objects, and are not necessarily used to describe a specific sequence or sequence.

[0052] The embodiment of the present application discloses a storage device testing method, which implements the storage device test at the customer's site and ensures the reliability of the storage device tested on site.

[0053] see figure 1 , a flow chart of a storage device ...

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Abstract

The invention discloses a storage device testing method and device, an electronic device and a computer readable storage medium. The method comprises the steps of determining a to-be-tested target storage device and a target test item; acquiring actual state information of the target test item of the target storage equipment by calling an acquisition command in a test script corresponding to the target test item; and comparing the actual state information with standard state information in the test script to obtain a test result of the target test item of the target storage device. According to the storage device testing method provided by the invention, batch testing of a plurality of storage devices is realized, the testing efficiency is improved, the detection period is shortened, testing of the storage devices is realized on a client site, and the reliability of the storage devices tested on site is ensured.

Description

technical field [0001] The present application relates to the field of computer technology, and more specifically, to a storage device testing method and device, an electronic device, and a computer-readable storage medium. Background technique [0002] During the transportation of the storage device to the customer site, it is likely to cause loosening of the internal cables of the storage device. The loosening of the cable will cause bit errors in the link of the device, and errors will occur when the device is stress tested. The equipment sent to the customer's site needs to be deployed in the environment. The connection problem of the optical fiber line will cause the network transmission rate to not reach the rated value, which will affect the performance test of the equipment. In order to avoid affecting the test progress and reliability due to equipment storage equipment matching problems at the customer site, it is necessary to efficiently and quickly test the deploy...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22H04B10/079
CPCG06F11/2273G06F11/221G06F11/2221H04B10/0795H04B10/07955
Inventor 邴栋
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD
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