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IC card distortion testing device

A twist testing device and card testing technology, which is applied in the direction of applying repeated force/pulsation force to test the strength of materials, can solve the problems that the card twist cannot be changed, the product cannot be shipped, and the technical requirements of modern production cannot be met. It is practical strong effect

Active Publication Date: 2016-06-01
AEROSPACE INFORMATION
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  • Claims
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AI Technical Summary

Problems solved by technology

[0004] The shortcoming of the above-mentioned IC card distortion testing method in the prior art is: the amount of distortion of the card is determined during design and cannot be changed, the test efficiency is very low, and it is a destructive test. After the test, it cannot be released as a product.
This method conducts sampling tests on IC cards during the production process and before leaving the factory, but cannot perform online batch testing on mass-produced IC cards.
Since the daily output of IC cards is very large, this method can no longer meet the technical requirements of modern production

Method used

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Embodiment Construction

[0023] In order to facilitate the understanding of the embodiments of the present invention, several specific embodiments will be taken as examples for further explanation below in conjunction with the accompanying drawings, and each embodiment does not constitute a limitation to the embodiments of the present invention.

[0024] The structural representation of the IC card distortion testing device that the embodiment of the present invention provides is as figure 1 and figure 2 shown in figure 2 Contains front view, right side view and top view. The above-mentioned device includes two combined devices with the function of transmitting the IC card and the function of twisting, and the two combined devices are installed on the bracket (S101) and placed oppositely. Each combined device is provided with an IC card test frame (S104), and each IC card test frame (S104) is provided with at least one transmission wheel and a transmission motor (S105) that makes the transmission ...

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Abstract

The embodiment of the invention provides an IC card distortion testing device. The device mainly includes two oppositely-placing combined devices; each combined device is provided with an IC card testing rack, each IC card testing rack is provided with at least one transmission wheel, and each IC card testing rack is connected with a distortion rotation motor through a transmission shaft; IC cards are arranged between the transmission wheels on the two IC card testing racks on the two combined devices; the two distortion rotation motors rotate a certain angle in the opposite directions, and the two distortion rotation motors drive the IC card testing racks through the transmission shafts to rotate the same angle in the opposite directions, so that the IC cards are twisted at the same angle. The device provided by the embodiment of the invention achieves IC card transfer function and IC card distortion testing function, can achieve IC card batch testing, also can perform distortion fatigue pressure testing on the IC cards, and changes the distortion quantity and the distortion direction of the IC cards by changing the motor rotation angles and direction parameters.

Description

technical field [0001] The invention relates to the technical field of IC card (Integrated Circuit Card, integrated circuit card) testing, in particular to an IC card distortion testing device. Background technique [0002] IC cards are used more and more widely in our life, and the number of usage is increasing. However, in the process of use, it often happens that the IC card cannot continue to be used after a period of use. Analyze the IC card returned after damage, except for the artificially damaged IC card, most of them are due to the virtual connection between the chip, virtual welding or coil deformation, which causes the IC card to be unusable after a period of time. Phenomenon. [0003] At present, a kind of IC card distortion test method in the prior art is: put the IC card in two card slots, force the IC card to twist and deform through the relative offset between the two card slots, and twist the gap between the card slots of the testing equipment. The relativ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/32
Inventor 王顺仁
Owner AEROSPACE INFORMATION
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