Memory testing device and method

Abstract

The invention provides a memory test device and a test method. The memory test device comprises a test control module and a test execution module, the test control module comprises a control chip anda first communication chip, and the control chip is in communication connection with the first communication chip; the test execution module comprises a second communication chip and a plurality of test execution groups, and the plurality of test execution groups are in communication connection with the second communication chip; the test execution group comprises a terminal capable of mounting atested memory; and the first communication chip is electrically connected with the second communication chip. Batch automatic testing can be carried out on the memory banks, the testing efficiency isgreatly improved, a C2 control chip is adopted in the testing control module, the structure is simple, a special control server is not needed, and the cost is saved.

Description

technical field

[0001] The invention belongs to the technical field of storage device testing, and in particular relates to a memory testing device and a testing method. Background technique

[0002] With the advancement of digital technology, whether it is a personal computer or a server, memory, a key component of high data exchange, is constantly being upgraded and replaced. It is precisely because memory plays a key role in data exchange performance that people are increasingly controlling memory quality.

[0003] Due to the fact that most of the current memory tests are still in the low-efficiency state of a single or 2-4 memory in a single machine, it cannot meet the needs of mass production for rapid inspection of qualified memory, which leads to delays in memory testing for production.

[0004] Based on the problem that the existing memory test cannot be tested in large quantities, a modular memory test module architecture is proposed to solve the existing problems....

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