Batch testing device and method of PCIE built-out card

A technology for batch testing and add-in cards, applied in error detection/correction, detection of faulty computer hardware, instruments, etc., can solve the problems of high cost and low test efficiency of PCIE add-in cards, and improve the test efficiency and convenience. View and analyze the effect of saving test costs

Inactive Publication Date: 2017-12-15
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a batch test device and method for PCIE add-in cards, which are used to solve the problems of low test efficiency and high cost of existing PCIE add-in cards

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  • Batch testing device and method of PCIE built-out card
  • Batch testing device and method of PCIE built-out card

Examples

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Embodiment Construction

[0027] In order to clearly illustrate the technical features of this solution, the present invention will be described in detail below through specific implementation modes and in conjunction with the accompanying drawings. The following disclosure provides many different embodiments or examples for implementing different structures of the present invention. To simplify the disclosure of the present invention, components and arrangements of specific examples are described below. Furthermore, the present invention may repeat reference numerals and / or letters in different instances. This repetition is for the purpose of simplicity and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. It should be noted that components illustrated in the figures are not necessarily drawn to scale. Descriptions of well-known components and processing techniques and processes are omitted herein to avoid unnecessarily limiting the...

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Abstract

The invention discloses a batch testing device and method of a PCIE built-out card. The testing device comprises a processing module, a data transmitting module and a testing module which are sequentially connected. The processing module comprises a plurality of CPUs connected through QPI. Each CPU is provided with a plurality of PCIE testing grooves. The processing module is used for processing test data. The data transmitting module is used for data transmission between the testing module and the processing module. The testing module comprises a network card testing unit and a storage testing unit which are connected with the data transmission module. The network card testing unit is used for testing network cards. The storage testing unit is used for testing storage cards. The testing method includes the steps that the tested cards are inserted in the corresponding PCIE testing grooves on a main board; corresponding testing is conducted according to the types of the tested cards; the test result is displayed and recorded. Compared with the prior art, the batch testing of the PCIE cards of multiple types can be conducted at the same time, testing efficiency is improved, and cost is saved.

Description

technical field [0001] The invention relates to the technical field of PCIE external card testing, in particular to a batch testing device and method for PCIE external cards. Background technique [0002] PCI-Express (peripheral component interconnect express) is a high-speed serial computer expansion bus standard, which can be abbreviated as PCIE, PCI-E or PCIe, and was proposed by Intel in 2001. Its main advantage is the high data transmission rate, the current highest 16X 2.0 version can reach 10GB / s, and there is still considerable development potential. [0003] Due to its high-speed and reliable transmission efficiency, hot plug and quality of service (QOS) and other functions, PCIE has been widely used in server external cards. Commonly used PCIE expansion cards include network cards and host adapter HBA cards. , host channel adapter HCA card, etc. [0004] Since the PCIe expansion card has no power supply and main data processor, the test needs to rely on the suppo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/221G06F11/2247
Inventor 穆德学
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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