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A kind of multi-dut parallel test method and system

A test method and test system technology, applied in transmission systems, digital transmission systems, electrical components, etc., can solve the problem of low instrument utilization, and achieve the effect of improving test efficiency

Active Publication Date: 2018-04-24
深圳市极致汇仪科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] (2): The ping-pong networking method only increases the time for rotating APs compared to method (1), and is essentially the same as method (1).
As a result, the utilization rate of the instrument is not high; according to the time slicing process, it can be seen that the only processes that actually use the instrument are: instrument setting, data acquisition

Method used

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  • A kind of multi-dut parallel test method and system
  • A kind of multi-dut parallel test method and system
  • A kind of multi-dut parallel test method and system

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Embodiment Construction

[0037] The invention discloses a multi-DUT parallel testing method, and the following steps are performed in a terminal:

[0038] The construction step is to construct multiple threads or processes, each thread or process is used to control a DUT, each thread or process is independent of each other, and a new thread management method is adopted to improve the processing speed. Specific thread management hierarchy diagram, such as Figure 5 shown. The main program is started by the UI main thread on the first layer, and the four sub-threads on the second layer are responsible for controlling the communication between the DUT and the UI thread. These four sub-threads are uniformly managed by the UI main thread, and can communicate with each other and view memory information; the third The first layer is a management thread for instrument application management. The second layer of thread must submit an instrument application request and wait for the result to use the instrument...

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Abstract

The invention provides a multi-DUT parallel testing method and system. The following steps are performed in the terminal: constructing steps, constructing multiple threads or processes, each thread or process is used to control a DUT, and each thread or process is independent of each other; synchronization; In the running step, each thread or process is independently connected to the tester. When controlling the DUT, each thread or process runs synchronously; in the instrument preemption step, when a thread or process completes the operation on the tester, the thread or process immediately releases the test tester resources so that other threads or processes can then use the tester. The beneficial effects of the present invention are: the present invention uses a PC, a WLAN tester, and a plurality of DUTs to be connected to different RF ports, and a plurality of DUTs are connected to a PC at the same time, so that one PC, one The WLAN tester simultaneously tests the functions of multiple DUTs, which can significantly improve the test efficiency of DUTs.

Description

technical field [0001] The invention relates to the testing field, in particular to a multi-DUT parallel testing method and system. Background technique [0002] The usual DUT test schemes are one-to-one or use ping-pong connection for testing. For DUT manufacturers, efficiency and test accuracy are the most important things they care about. So a set of parallel testing DUT scheme is particularly important. [0003] Decomposition of the current DUT test timing: the size of the slice granularity of the time taken by the instrument during the test determines the length of the test time. The finer the slice granularity, the shorter the test time. vice versa. At present, most of the test software has a very large granularity for the time slice controlled by the instrument. Let’s use the TX of DUT to illustrate, the basic process: (1) DUT setting 1 > (2) instrument setting → (3) DUT starts to send data → (4) instrument collects data → (5) data analysis → (6) judgment Resu...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04L12/26
Inventor 别体军肖鸽吴帅
Owner 深圳市极致汇仪科技有限公司