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A bsdf measurement system and method for eliminating ambient light interference

A measurement system and ambient light technology, applied in the field of material optical scattering characteristics measurement, can solve the problems of harsh measurement conditions and influence on the accuracy of measurement results, and achieve the effect of facilitating optical simulation and eliminating the interference of ambient light.

Active Publication Date: 2017-05-31
SOUTH CHINA UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0014] At present, the existing BSDF measurement devices or the patented measurement process need to be carried out in a dark environment, and the accuracy of the measurement results will be affected when there is ambient light interference, so the requirements for the measurement conditions are more stringent

Method used

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  • A bsdf measurement system and method for eliminating ambient light interference
  • A bsdf measurement system and method for eliminating ambient light interference
  • A bsdf measurement system and method for eliminating ambient light interference

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Embodiment

[0044] as the picture shows. A BSDF measurement system for eliminating ambient light interference of the present invention comprises a frame platform, a measurement platform 2, a rocker probe mechanism, a control module 6, a data acquisition module 7 and a PC 8; the frame platform is divided into a low platform 11 and high platform 12;

[0045] The measuring platform 2 is placed on the low platform 11, the measuring platform 2 includes a rotating base 21, a support frame 22 arranged on the rotating base 21, the upper part of the supporting frame 22 has a bearing platform, and the bearing platform is provided with an annular sample platform 23. A laser 3 with an electric shutter 4 is arranged on the annular sample stage 23. The laser 3 is connected to the dial mechanism 34 provided on the load-bearing platform through the rotating rod 33. The laser 3 can rotate around the C axis 360 through the rotating rod 33. ° rotation; adjust the incident zenith angle of the laser 3 laser ...

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Abstract

The invention discloses a BSDF (Bidirectional Scattering Distribution Function) measurement system and method for eliminating ambient light interference. The system comprises a rack platform, a measurement platform, a rocker arm probe mechanism, a control module, a data acquiring module and a PC; the measurement platform comprises a rotary base, a support frame arranged on the rotary base, a bearing table, an annular sample stable, and a laser; laser irradiates the surface of a measured sample in measurement, and then light scattering conditions of measurement points in a semi sphere can be measured through the rotation of a rocker arm and the autorotation of the sample table after the laser is reflected or transmitted; a power-driven shutter is used for controlling on-off of a laser path in measurement, each measurement point is measured to obtain data at laser irradiation and non-laser irradiation (only ambient light), and the two data is subtracted to remove the ambient light component so as to obtain accurate BDSF measurement data. Through the system, the interference of the ambient light can be automatically eliminated, the measurement does not need to be performed in dark environment, and the system is widely suitable for measured samples with various material attributes.

Description

technical field [0001] The invention relates to the measurement of optical scattering characteristics of materials, in particular to a BSDF measurement system and a measurement method for eliminating ambient light interference. Background technique [0002] The Bidirectional Scattering Distribution Function (BSDF) is a measure of the intensity of light scattered from different directions on a surface. The BSDF is a function that includes both the incident direction and the scattering direction, so it is called "bidirectional". It is defined as the ratio of the outgoing radiance in a certain outgoing direction to the incident irradiance incident on the surface of the material, and its mathematical expression is: [0003] [0004] In the formula, θ i is the incident zenith angle; is the incident azimuth; θ s is the exit zenith angle; is the outgoing azimuth. is the radiance in the outgoing direction; is the irradiance in the incident direction. [0005] Bidirect...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/47
Inventor 陈家晓李宗涛汤勇李家声吴宇旋王卉玉邓文君
Owner SOUTH CHINA UNIV OF TECH