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Device and method for testing 1-wire signals

A technology of testing device and testing method, which is applied in the direction of detecting faulty computer hardware, etc., can solve the problems of long testing time and waste of welding materials, etc., and achieve the effect of simple testing process, saving testing time and material cost

Inactive Publication Date: 2015-06-03
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This test method not only requires a long test time, but also wastes welding materials

Method used

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  • Device and method for testing 1-wire signals
  • Device and method for testing 1-wire signals
  • Device and method for testing 1-wire signals

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] see figure 1 , in a preferred embodiment of the present invention, a test device 10 is used to measure the 1-wire signal on the main board 20 of the server. The server mainboard 20 includes a functional module 22 for sending the 1-wire signal. The testing device 10 includes a circuit board 11 , a memory chip 12 for storing the 1-wire signal, and an oscilloscope 13 for testing the 1-wire signal.

[0028] see Figure 1-2 , the circuit board 11 includes a first connector 111 , a second connector 112 and a third connector 113 . The first connector 111 is connected between the functional module 22 and the second connector 112 , and the second connector 112 is connected between the first connector 111 and the memory chip 12 . The functional module 22 implements 1-wire signal transmission with the memory chip 12 through the first connector 111 and the second connector 112 . The third connector 113 is electrically connected to the first connector 111, the second connector 1...

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Abstract

The invention provides a testing device for testing 1-wire signals on a server mainboard. The server mainboard comprises a functional module for transmitting the 1-wire signals; the testing device comprises an oscilloscope for testing the 1-wire signals and a memory chip for storing the 1-wire signals; the testing device further comprises a circuit board; the circuit board comprises a first connector, a second connector and a third connector; the first connector is connected between the functional module and the second connector, while the second connector is connected between the first connector and the memory chip; the 1-wire signals can be transmitted between the functional module and the memory chip by use of the first connector and the second connector; the third connector is electrically connected with the first connector, the second connector and the oscilloscope, so that the oscilloscope is capable of measuring the 1-wire signals between the first connector and the second connector.

Description

technical field [0001] The invention relates to a test device and a test method thereof, in particular to a test device capable of measuring 1-wire signals and a test method thereof. Background technique [0002] The controllers of various server motherboards include 1-wire functional modules. In the production stage, testers need to measure and test the 1-wire signals of the 1-wire functional modules. In the existing test method, the tester needs to manually weld the 1-wire functional module on the main board of the server and the test auxiliary tool together through the auxiliary material transmission line. This test method not only requires a long test time, but also wastes welding materials. Contents of the invention [0003] In view of the above, it is necessary to provide a test device and a test method thereof that can measure 1-wire signals without soldering. [0004] A test device, used to measure the 1-wire signal on the server main board, the server main board...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
Inventor 陈雪李孟冬
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD