A screening method for analog input flicker tester

Abstract

The invention discloses a screening method for an analog input type flicker tester, which belongs to the field of power system flicker signal testing. The specific steps include: 1. Using the IEC61000-4-15 standard test signal to test the analog input type flicker tester Carry out a test to preliminarily judge whether the analog input type flicker tester meets the design requirements of the IEC61000‑4‑15 flicker test standard; 2. The structural level flicker signals are respectively the first signal, the second signal and the third signal; 3. Use the constructed hierarchical flicker signal to test the analog input type flicker tester, and further judge whether it is designed in strict accordance with the IEC61000‑4‑15 flicker test standard. The invention can identify whether the analog input type flicker tester or power quality monitor (including flicker measurement function) designed by various manufacturers strictly meets the design requirements of the IEC61000-4-15 flicker standard and obtains the corresponding test accuracy.

Description

technical field [0001] The invention relates to the field of flicker signal testing in power systems, in particular to a method for screening analog input type flicker testers. Background technique [0002] Aiming at the voltage flicker problem caused by voltage amplitude fluctuations in the current power system, its detection and evaluation are based on the IEC61000-4-15 standard [1] , International Electrotechnical Commission (International Electrotechnical Commission) referred to as IEC. Flicker detection under the IEC61000-4-15 flicker standard needs to go through a series of processes, such as squaring, filtering, statistics, etc. The design of the actual digital flicker meter is relatively complicated, and the hardware cost of the design is also high. In order to reduce the research and development cost of the flicker tester, some hardware manufacturers do not strictly follow the flicker design requirements of the IEC61000-4-15 standard, and simplify the flicker detec...

AI Technical Summary

Problems solved by technology

However, there are two unavoidable problems: one is that DFT is only suitable for steady-state signals, and there is spectrum leakage for flicker signals with large voltage amplitude fluctuations, and the decomposition error is too large to be applicable; the other is that it is impossible to eliminate spectrum leakage and fence effects, which affect the decomposition results and lead to errors

Although the flicker signal average statistical method has simplified the instantaneous flicker classification and statistics, the instantaneous flicker average value is used to replace the classification and statistical process in the IEC61000-4-15 flicker standard. When the voltage waveform is stable The measurement accuracy of flicker is high, but the actual voltage flicker signal fluctuates at any time, especially when the voltage amplitude fluctuates greatly, there is a large deviation in the flicker measurement results of the flicker signal average statistical method, and then Causes flicker evaluation to go wrong

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