Solar cell spring test probe

Abstract

The invention discloses a solar cell spring testing probe and relates to matching members for solar cell testing, in particular to a probe member for testing electrical performance of solar cell. The solar cell spring testing probe sequentially comprises a connecting head, a spring portion and a contact from top to bottom, the connecting head, the spring portion and the contact are of an integral structure, the spring portion is a S-like spring, and the contact is linear. The connecting head, the spring portion and the contact are designed to be of the integral structure, the connecting head is fixed inside a testing device, and the spring portion and the contact are compressed through the testing device to realize testing. Due to the integral structure, production cost is lowered, jamming between the spring and the contact is reduced, the solar cell spring testing probe is less prone to being damaged and high in practicability, and testing resistance and light shading area are reduced.

Description

technical field [0001] The invention relates to a solar battery sheet test fitting, in particular to a probe piece for testing the electrical properties of a solar battery sheet. Background technique [0002] With the society's increasing demand for energy and the country's emphasis on and support for green energy, the solar cell industry has developed vigorously. During the production process of solar cells, various electrical properties of the cells must be tested, such as In the IV test of photovoltaic cells, it is necessary to collect the current and voltage information generated by the cells under certain lighting conditions; while in the detection of electroluminescent defects, it is necessary to test the cells with power. At present, the collection or power-on of the electric signal of the battery is to use the test needle to contact the main grid line on the battery, and the existing test probe is mostly composed of three parts: the probe cover, the spring, and the p...

AI Technical Summary

Problems solved by technology

[0003] 1. The production cost is high; the traditional test needle is composed of three parts: probe cover, spring and probe head. The assembly process of these three parts is relatively complicated and requires manual processing and combination, which has certain requirements for the accuracy of the product. cost of production

[0004] 2. It is easy to be damaged; the inside of the traditional test needle is a spring core. Since the spring is arranged between the probe head and the probe cover, it is easy to be elastically deformed after a long period of pressing down, resulting in a gap between the probe head and the probe cover. Once the jamming phenomenon occurs, it will crush the busbar on the cell and damage the cell, and the probe must be replaced

[0005] 3. The service life is short; since the probe cover and the probe head are slidingly connected, after long-term use, wear occurs between the inner wall of the probe cover and the outer wall of the probe head, which will cause poor contact and make the The series resistance test is unstable, which affects the FF test accuracy and interferes with the test results

[0006] 4. Large resistance; in the IV test, the current and voltage of the battery under test are small, but in the traditional test probe structure, the current conducts electricity through the probe head, spring, and probe, and each component will have resistance, which will cause current and voltage loss, resulting in the inability to accurately collect the current, causing unpredictable effects on the test results, and failing to achieve the purpose of accurate measurement

[0007] 5. Large shading area

Since the spring in the probe cover cannot be too thin, it is difficult for the diameter of the traditional probe to be less than 1mm, and the probe cover will be larger, which determines that the test knife should not be too thin, so that the shading area is larger, which is very important for IVs that require precise measurement. data is very bad

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