75 results about "Spring Test" patented technology

A test fixture for testing loaded printed circuit boards having a plurality of test points having a probe plate including an array of widely spaced high force spring test probes in compliant contact with solid translator pins located in a translator fixture removably positioned over the probe plate. The test fixture includes optimization software wherein translation of the test signals are optimized by providing the shortest interconnect distance in the x-y plane between the test points on the printed circuit board and the test probes in the probe plate. The fixture further includes an unpowered opens device for testing components on the loaded printed circuit board.

The invention discloses a spring deformation performance testing device. The spring deformation performance testing device comprises a support, a driving assembly and a sliding rod, wherein the support comprises supporting pieces, a fixing piece and a bearing piece; the sliding rod slidably penetrates through the fixing piece and the bearing piece; each supporting piece is rectangular frame-shaped, and the supporting pieces comprise two long frame sides and two short frame sides; the bearing piece and the fixing piece are arranged at interval; sliding blocks are arranged on the bearing piece, and the sliding blocks are slidably arranged between the two long frame sides; the driving assembly is used for driving the sliding rod to linearly move back and forth. A spring to be tested can sleeve the sliding rod and be located between a pressing portion and the bearing piece, and a space for spring testing can be formed between the fixing piece and the bearing piece; by sliding the sliding blocks in the frame-shaped supporting pieces and locking the sliding blocks through locking bolts, the adjustment of the position of the bearing piece relative to the supporting pieces can be realized, and thus the space between the fixing piece and the bearing piece is adjusted to install springs with different length; since the supporting pieces are frame-shaped, the stability is good and the sliding fitting with the sliding blocks is facilitated.

The invention discloses a spring tester providing stretching test function. The spring tester comprises a base, wherein a portal frame is arranged on the base; the bottom of the portal frame is fixed on the base; and a measuring disc is arranged between support pillars of the portal frame, and is fixed on the base. According to the invention, the portal frame and relevant equipment are arranged on the spring tester, so that the spring tester can perform pressure test and tension test at the same time, the test cost is saved, and the efficiency is increased.

The invention discloses a combiner box automatic pairing testing system and a testing tool thereof. The combiner box automatic pairing testing system comprises a direct voltage testing part, a direct voltage testing part, and a testing tool used for fixed installation of tested work pieces constituted by measuring plates and manifolds. The testing tool comprises a base, which is provided with a group of spring testing needles used for conductive inserted connection with terminals of tested work pieces during the test. Each spring testing needle comprises an input spring testing needle and an output spring testing needle. The base is also provided with a pressing mechanism used for pressing the tested work pieces tightly, after the tested work pieces are disposed on the spring testing needles. During the use, the to-be-tested work pieces are directly connected with the spring testing needles disposed on the base in an inserted manner, and the conductive connection between the corresponding terminals of the to-be-tested work pieces and the spring testing needles is completed. The bottom parts of the spring testing needles are connected with a voltage source or a current source by leads, and then during the test, the tested work pieces are only required to be connected with the spring testing needles in an inserted manner, and wiring operation is saved, and therefore testing efficiency is improved.

The invention discloses a spring test device, which comprises a driving module, a hydraulic loop module and a loading stress module. The driving module is connected with the hydraulic loop module through a connecting rod; and the hydraulic loop module is connected with the loading stress module through a stretching rod. The hydraulic loop module is driven by the driving module, and thus a spring realizes a purpose of spring quality and life test under the function of the loading stress module.

A test fixture for testing loaded printed circuit boards having a plurality of test points having a probe plate including an array of widely spaced high force spring test probes in compliant contact with solid translator pins located in a translator fixture removably positioned over the probe plate. The test fixture includes optimization software wherein translation of the test signals are optimized by providing the shortest interconnect distance in the x-y plane between the test points on the printed circuit board and the test probes in the probe plate. The fixture further includes an unpowered opens device for testing components on the loaded printed circuit board.

The invention is applicable to the technical field of micro-system tests, and provides a through-silicon-via channel testing device, which comprises a mounting base and at least one group of probe assemblies which are used for testing a through-silicon-via channel and supporting a through-silicon-via adapter plate, wherein each probe assembly comprises a first spring test probe and a second springtest probe, the mounting base comprises a first support portion and a second support portion, the first spring test probe is arranged on the first support portion, and the second spring test probe isarranged on the second support portion. The through-silicon-via channel testing device overcomes the defects that the conventional probe station testing method has high threshold, faces the through-silicon-via channel indirectly and the like through arranging the first support portion and the second support portion which can be used for testing both ends of the through-silicon-via channel simultaneously, reduces the operation steps and is simple in operation compared to the existing testing method, and has the advantages of simple structure, low manufacturing cost and easy popularization.