Spring test probe

Abstract

The invention relates to a spring test probe, particularly to a probe element for testing the electrical performance of a solar cell slice. The spring testing probe having an integrated structure is composed of a connecting head, a buffer part and a contact successively from top to bottom. The buffer part has a multi-stage spring structure; and the basic spring is a torsion spring. And the contact is in a shape like a straight line. When the probe is in use, the connecting head is fixed inside a testing device and the testing device compresses the buffer part and the contact for testing. With the multi-stage spring and the torsion spring of the buffer part, the flexibility and adaptability as we as the ability to repair of the probe are improved; and thus the probe is not easy to damage.

Description

technical field [0001] The invention relates to a spring test probe, in particular to a probe piece for testing the electrical properties of solar cells. Background technique [0002] During the production of solar cells, various electrical properties of the cells need to be tested. For example, in the IV test of photovoltaic cells, it is necessary to collect the current and voltage information data generated by the cells under certain lighting conditions. At present, the collection of the electric signal of the cell is to use the test needle to contact the busbar on the cell, and the existing test probe is mostly composed of a probe cover, a spring, and a probe head. The spring is arranged on the probe cover. Between the probe heads of the box, the probe cover is pressed down during the test, and the probe cover drives the probe head to press down to contact the bus bar on the battery sheet, and makes close contact under the action of the spring thrust. The current and vo...

AI Technical Summary

Problems solved by technology

[0003] The current traditional test probes have the following defects: high production costs, components need to be assembled, and product accuracy is required; easy to damage, the spring is prone to plastic deformation after long-term pressing, resulting in jamming between the probe head and the probe cover , thus damaging the battery sheet; short life, the sliding connection between the probe head and the probe cover, long-term wear and tear will cause poor contact, making the test data unstable, affecting test accuracy, and interfering with test results; large resistance, each The components all have resistance, which will cause current and voltage loss, resulting in the inaccurate collection of current and unpredictable effects on test results; the large shading area, large diameter of traditional probes, and larger probe covers are not good for data accuracy collection

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