Spring test probe

A technology for testing probes and torsion springs, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables. It can solve problems such as unfavorable data accuracy acquisition, poor contact, and impact on test accuracy, so as to reduce the shading area, avoid sliding wear, The effect of reducing production costs

Inactive Publication Date: 2017-12-15
浙江德清众鑫盛五金弹簧有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The current traditional test probes have the following defects: high production costs, components need to be assembled, and product accuracy is required; easy to damage, the spring is prone to plastic deformation after long-term pressing, resulting in jamming between the probe head and the probe cover , thus damaging the battery sheet; short life, the sliding connection between the probe head and the probe cover, long-term wear and

Method used

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  • Spring test probe

Examples

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Embodiment Construction

[0011] The spring test probe of the present invention is used to test the electrical properties of solar cells, the spring test probe is an integrally formed structure, and a linear connector 1, a buffer part 2 and a contact 3 are arranged in sequence from top to bottom, The buffer part 2 is a two-stage spring system, the basic spring of which is a coil of torsion spring 4 . The linear connector 1 , the torsion spring 4 of the buffer part, and the contact 3 of the probe described in this embodiment are all rings with equal diameters, with a diameter of 0.5 mm. The two-stage spring system based on the torsion spring in this embodiment has a better buffering effect between the connector 1 and the contact 3. It is flexible, not easy to damage, and has strong repairability, which can effectively prevent the spring from repeating. Plastic deformation under pressure.

[0012] When in use, install the probe on the test device, adjust the position, align it with the main grid line of...

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PUM

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Abstract

The invention relates to a spring test probe, particularly to a probe element for testing the electrical performance of a solar cell slice. The spring testing probe having an integrated structure is composed of a connecting head, a buffer part and a contact successively from top to bottom. The buffer part has a multi-stage spring structure; and the basic spring is a torsion spring. And the contact is in a shape like a straight line. When the probe is in use, the connecting head is fixed inside a testing device and the testing device compresses the buffer part and the contact for testing. With the multi-stage spring and the torsion spring of the buffer part, the flexibility and adaptability as we as the ability to repair of the probe are improved; and thus the probe is not easy to damage.

Description

technical field [0001] The invention relates to a spring test probe, in particular to a probe piece for testing the electrical properties of solar cells. Background technique [0002] During the production of solar cells, various electrical properties of the cells need to be tested. For example, in the IV test of photovoltaic cells, it is necessary to collect the current and voltage information data generated by the cells under certain lighting conditions. At present, the collection of the electric signal of the cell is to use the test needle to contact the busbar on the cell, and the existing test probe is mostly composed of a probe cover, a spring, and a probe head. The spring is arranged on the probe cover. Between the probe heads of the box, the probe cover is pressed down during the test, and the probe cover drives the probe head to press down to contact the bus bar on the battery sheet, and makes close contact under the action of the spring thrust. The current and vo...

Claims

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Application Information

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IPC IPC(8): G01R1/067
CPCG01R1/06716
Inventor 张冲
Owner 浙江德清众鑫盛五金弹簧有限公司
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