Method for predicting test-flight fault load

A load and fault technology, applied in calculations, special data processing applications, instruments, etc., can solve problems such as time-consuming and low calculation accuracy, and achieve the effects of reducing uncertainty, improving design efficiency, and shortening troubleshooting and design time

Active Publication Date: 2015-09-09
XIAN AIRCRAFT DESIGN INST OF AVIATION IND OF CHINA
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Problems solved by technology

[0004] The purpose of the present invention is to provide a method for predicting flight test fault loads to solve

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  • Method for predicting test-flight fault load
  • Method for predicting test-flight fault load
  • Method for predicting test-flight fault load

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Embodiment Construction

[0020] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated.

[0021] Such as figure 1 As shown, a kind of flight test failure load prediction method provided by the present invention comprises:

[0022] Step S101, obtaining the maximum landing weight of the aircraft to be tested.

[0023] Step S102, obtaining the critical weight of the aircraft under test when the high-lift device is released.

[0024] Step S103, according to the following formula (1), determine the ratio η of the high-lift system load to the design demand load when the fault occurs:

[0025] η = W 1 W 0 × 1...

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Abstract

The invention relates to the field of aircraft high-lift system design and flight mechanics, in particular to a method for predicting a test-flight fault load, and aims to solve the problems that the existing method for predicting test-flight fault load is long in consumed time and low in calculation accuracy. According to the method for predicting the test-flight fault load of the invention, based on the relationship between the aircraft high-lift system test-flight fault load and two weight data of an aircraft, a test-flight load of a fault location can be calculated through the relatively easily obtained two weight data of the aircraft, so as to determine the relationship between the test-flight load of the fault location and a design required load. The method can provide a reliable technical support for the high-lift system design, the fault location and the like, can reduce the uncertainty of original method, and can shorten the troubleshooting and designing time.

Description

technical field [0001] The invention relates to the fields of aircraft high-lift system design and flight mechanics, in particular to a method for predicting flight test failure loads. Background technique [0002] During the flight test stage of newly developed aircraft and the flight process of active aircraft, there will often be a fault that the high-lift system cannot drive the booster device to release. This fault will lead to a landing failure without flaps (growth device), which seriously affects flight safety. [0003] The current practice is to determine the flight test failure load based on the flight parameter data at the time of the failure. This method has the following disadvantages: First, the flight parameter data in the fault state is generally incomplete for the aerodynamic calculation requirements, and the accuracy of some parameters cannot be guaranteed, and CFD or other engineering methods are required for calculation, which takes a long time and has lo...

Claims

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Application Information

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IPC IPC(8): G06F19/00
Inventor 左朋杰张建刚
Owner XIAN AIRCRAFT DESIGN INST OF AVIATION IND OF CHINA
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