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Sample preparation method for in-situ observation of material matrix/passivation film interface structure by tem

A technology of sample preparation and interface structure, which is applied in the preparation of test samples, instruments, scanning probe technology, etc., can solve the problems of complex operation and low success rate of focused ion beam sample preparation

Active Publication Date: 2019-07-19
CHINA PETROLEUM & CHEM CORP +1
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Problems solved by technology

[0008] The present invention mainly solves the problem of sample preparation for in-situ observation of the material matrix / passivation film interface by TEM. It not only needs to avoid the damage effect of the traditional TEM sample preparation method on the passivation film near the interface, but also needs to solve the complicated operation of sample preparation by using focused ion beams. low success rate

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  • Sample preparation method for in-situ observation of material matrix/passivation film interface structure by tem
  • Sample preparation method for in-situ observation of material matrix/passivation film interface structure by tem
  • Sample preparation method for in-situ observation of material matrix/passivation film interface structure by tem

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preparation example Construction

[0025] The invention provides a sample preparation method for EM in-situ observation of material matrix / passivation film interface structure, which comprises:

[0026] The first step is metallographic sample preparation;

[0027] The second step is thinning by ion sputtering;

[0028] The third step is to corrode the metal sample to obtain the sample.

[0029] The first step is further specifically to use wire cutting or other cutting methods to prepare a metal sheet that meets the size required by the TEM sample; put the metal material sample in a solvent, clean it, and perform rough grinding, fine grinding, and fine grinding on a metallographic pre-grinder. Grinding and polishing to obtain base metal samples.

[0030] The solvent used is acetone or ethanol.

[0031] The cleaning method adopts the ultrasonic cleaning method.

[0032] The second step is further specifically to reduce the thickness of the basic metal sample prepared in the first step to meet the requirement...

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Abstract

The invention provides a preparation method for a TEM in-situ observation material matrix / passivation film interface structure sample. The method includes: first step, metallographic sample preparation; second step, ion sputtering thinning; and third step, corrosion of metal specimens, thus obtaining the sample. The preparation method for the TEM in-situ observation material matrix / passivation film interface structure sample provided by the invention avoids the destructive effect of the traditional TEM sample preparation method to the passivation film near the interface, also solves the problems of complex operation and low success rate in sample preparation by focused ion beam.

Description

technical field [0001] The invention relates to the technical field of transmission electron microscope microscopic detection, in particular to a sample preparation method for in-situ observation of material matrix / passivation film interface structure by TEM. Background technique [0002] Transmission Electron Microscope (TEM) is an important tool in electron microscopy, which can simultaneously analyze the microstructure, crystal structure, constituent elements, chemical bond state, and electron distribution structure of micro-regions. It is widely used to observe the microscopic world of the material body, such as interface, strain state, strain relaxation, dislocation, and various material microscopic defects. It can also be used to observe corrosion products, such as the microscopic morphology and phase structure of rust layer substances. [0003] With the deepening of research, when studying the corrosion resistance of metal materials, it is necessary to understand the...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N1/28G01N1/32G01N1/34G01Q30/20
Inventor 屈定荣蒋秀刘小辉
Owner CHINA PETROLEUM & CHEM CORP