Integrated circuit test system digit channel transmission delay calibration method and system
A test system and transmission delay technology, applied in the field of transmission delay calibration of digital channels, can solve the problems of inability to judge the measurement results of the test system, inability to evaluate the influence of the measurement accuracy of the AC parameters of integrated circuits, etc., and achieve scalability and portability. Good, easy to transport, high precision effect
Active Publication Date: 2015-09-23
NO 709 RES INST OF CHINA SHIPBUILDING IND CORP
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Problems solved by technology
At present, there is no effective calibration method to calibrate the transmission delay of the digital channel, so it is impossible to judge whether the measurement result of the transmission delay by the test system is accurate, and it is impossible to evaluate the influence of the transmission delay of the digital channel on the measurement accuracy of the AC parameters of the integrated circuit
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[0021] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention and are not intended to limit the invention.
[0022] The present invention provides a transmission delay calibration method and system for digital channels of an integrated circuit test system, comprising figure 1 It can be seen that the transmission delay calibration system of the digital channel of the integrated circuit test system includes an integrated circuit test system 10, a calibration main control computer 20, an oscilloscope 30, a standard delay line 40 and a calibration adapter interface board 50, and the integrated circuit test system 10. Calibrate the main control computer 20, the oscilloscope 30, the standard delay ...
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The invention discloses an integrated circuit test system digit channel transmission delay calibration method comprising the following steps: arranging a TDR measure module TDR measure program capable of realizing transmission delay on an integrated circuit test system; combining a digit channel to form different transmission delay measure channels, and the integrated circuit test system is driven by the TDR measure module TDR measure program so as to send a measure pulse; the measure pulse is broadcasted by the transmission delay measure channel, reflected in the end and returned in an original path, and the integrated circuit test system can monitor an echo signal of the returned pulse according to a control indication sent by the TDR measure module TDR measure program; the obtained echo data is processed by a difference positioning algorithm, thus calculating a final transmission delay time of the digit channel. A conventional measure method can only measure a channel physics pathway delay time, cannot realize channel transmission delay calibration, the integrated circuit test system digit channel transmission delay calibration method can solve the said technical problems, is high in accuracy, good in extensible performance, and convenient in transport.
Description
technical field [0001] The invention relates to the measurement field of an integrated circuit test system, in particular to a transmission delay calibration method and system for a digital channel of an integrated circuit test system. Background technique [0002] With the rapid development of the integrated circuit industry, the working speed of digital integrated circuits continues to increase, so higher requirements are put forward for the test rate and AC parameter measurement accuracy of the integrated circuit test system. The objectively existing digital channel transmission delay has always been the main factor hindering the improvement of the accuracy of the AC parameter measurement of the integrated circuit test system. The channel propagation delay causes the problem of degraded measurement accuracy of AC parameters. Therefore, whether the measurement result of the channel transmission delay by the test system is accurate is directly related to whether the measur...
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IPC IPC(8): G01R35/00
Inventor 顾翼石坚张明虎周红
Owner NO 709 RES INST OF CHINA SHIPBUILDING IND CORP