Transmission delay calibration method and system for digital channel of integrated circuit test system
A test system and transmission delay technology, which is applied in the field of transmission delay calibration of digital channels, can solve the problems of inability to judge the measurement results of the test system and the inability to evaluate the influence of the measurement accuracy of the AC parameters of integrated circuits, etc., to achieve scalability and portability Good, convenient transportation, high precision effect
Active Publication Date: 2017-12-29
NO 709 RES INST OF CHINA SHIPBUILDING IND CORP
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Problems solved by technology
At present, there is no effective calibration method to calibrate the transmission delay of the digital channel, so it is impossible to judge whether the measurement result of the transmission delay by the test system is accurate, and it is impossible to evaluate the influence of the transmission delay of the digital channel on the measurement accuracy of the AC parameters of the integrated circuit
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[0021] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention and are not intended to limit the invention.
[0022] The present invention provides a transmission delay calibration method and system for digital channels of an integrated circuit test system, comprising figure 1 It can be seen that the transmission delay calibration system of the digital channel of the integrated circuit test system includes an integrated circuit test system 10, a calibration main control computer 20, an oscilloscope 30, a standard delay line 40 and a calibration adapter interface board 50, and the integrated circuit test system 10. Calibrate the main control computer 20, the oscilloscope 30, the standard delay ...
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The invention discloses a method for calibrating the transmission delay of a digital channel of an integrated circuit test system, comprising the following steps: setting a TDR measurement program on the integrated circuit test system that can realize the measurement of the transmission delay TDR measurement module; and combining the digital channels to construct different transmission The delay measurement channel is driven by the TDR measurement module TDR measurement program to send the test pulse from the integrated circuit test system; the test pulse propagates through the transmission delay measurement channel, reflects at the end and returns along the original path, and the integrated circuit test system measures according to the TDR measurement module TDR The control command issued by the program monitors the echo signal of the return pulse; the obtained echo data is processed through the differential positioning algorithm to calculate the final transmission delay time of the digital channel. It solves the technical problem that the traditional measurement method can only measure the channel physical channel delay time but cannot realize channel transmission delay calibration. It has the characteristics of high accuracy, good scalability, and convenient transportation.
Description
technical field [0001] The invention relates to the measurement field of an integrated circuit test system, in particular to a transmission delay calibration method and system for a digital channel of an integrated circuit test system. Background technique [0002] With the rapid development of the integrated circuit industry, the working speed of digital integrated circuits continues to increase, so higher requirements are put forward for the test rate and AC parameter measurement accuracy of the integrated circuit test system. The objectively existing digital channel transmission delay has always been the main factor hindering the improvement of the accuracy of the AC parameter measurement of the integrated circuit test system. The channel propagation delay causes the problem of degraded measurement accuracy of AC parameters. Therefore, whether the measurement result of the channel transmission delay by the test system is accurate is directly related to whether the measur...
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IPC IPC(8): G01R35/00
Inventor 顾翼石坚张明虎周红
Owner NO 709 RES INST OF CHINA SHIPBUILDING IND CORP