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Light Microscopy and Microscopy Methods

A technology of optical microscope and optical device, which is applied in the field of microscopy, can solve problems such as poor signal-to-noise ratio, achieve good signal-to-noise ratio, reduce sample light, and improve resolution

Active Publication Date: 2017-12-01
CARL ZEISS MICROSCOPY GMBH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0022] In these known swirl-sheet microscopes, the range of optically limited resolution can only be reached with a poor signal-to-noise ratio

Method used

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  • Light Microscopy and Microscopy Methods
  • Light Microscopy and Microscopy Methods
  • Light Microscopy and Microscopy Methods

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Embodiment Construction

[0072] figure 2 An exemplary embodiment of an optical microscope 100 according to the invention is shown schematically. As main components, the optical microscope comprises a light source 10 for emitting illumination light 15, a sample plane 40, a detector device 60 for detecting the sample light 45, and a scanning device 50, on which the sample 41 to be investigated can be positioned. middle.

[0073] An illumination scanning movement of the illumination light beam 15 over the sample plane 40 is carried out by the scanning device 50 . Furthermore, the scanning device 50 moves the receiving region in the sample plane 40 , from which specific detector elements 61 , 62 of the detector device receive sample light. This movement is called probe scanning movement. By specially designing the scanning device 50, the directions of the illumination scanning movement and the detection scanning movement are always opposite to each other.

[0074] The light source 10 may include a pl...

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Abstract

The invention relates to an optical microscope having a sample plane on which a sample to be studied can be positioned, the optical microscope having a light source for emitting illumination light, and an optical imaging device for directing the illumination light into the sample plane. A device and a detector arrangement having a plurality of detector elements for detecting sample light from a sample. In this case, the distance between adjacent detector elements is smaller than the Airy disk produced by a point in the sample plane on the detector device. The optical microscope according to the invention is characterized in that a scanning device is provided with at least a first and a second optical device, the optics of which can be moved simultaneously in a common direction in order to generate illumination scanning movements in opposite directions to one another. and detecting the scanning motion, the first and the second optical device each having a plurality of optical elements arranged side by side, by means of which optical elements spaced apart from each other can be simultaneously studied, the first and the second optical device being arranged such that from the sample plane The optical path of the sample light towards the detector device and the optical path of the illumination light from the light source towards the sample plane both pass through the first optical device and only one of these two light paths passes through the second optical device and in order to achieve the opposite direction to the illumination scanning movement The direction of the detection scanning motion enables the sample light to be imaged non-invertedly and with an imaging ratio less than 1 by the scanning device.

Description

technical field [0001] The invention relates to an optical microscope according to the preamble of claim 1 . The invention also relates to a microscopy method according to the preamble of claim 13 . Background technique [0002] An optical microscope of the type according to the invention has a sample plane on which the sample to be investigated can be positioned, a light source for emitting illumination light, an optical system for guiding the illumination light into the sample plane Imaging device and detector arrangement for detecting sample light from a sample, wherein the distance between adjacent detector elements from each other is smaller than the Airy disk produced on the detector arrangement by a point in the sample plane . Electronics determine an image of the sample based on the detected light from the sample. [0003] In a microscopy method of the type according to the invention, for the study of a sample positioned on the sample plane of an optical microscop...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B21/00G02B27/58
CPCG02B21/0032G02B21/0036G02B21/008G02B21/0044G02B21/0072G02B21/0076G02B27/58G02B21/025
Inventor W.巴思R.内茨
Owner CARL ZEISS MICROSCOPY GMBH
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