Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Design and evaluation method of a detector structure high overload tightening test

A technology of test design and detectors, which is applied in the fields of instruments, calculations, and special data processing applications, etc., can solve the problems that there is no comprehensive reliability verification scheme specifically proposed, and there are few researches on the reliability of bomb detector structures.

Active Publication Date: 2018-03-16
BEIHANG UNIV
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, if the counting method is used to evaluate the reliability of success or failure products, according to GB5080.5-1985-T "Verification Test Plan for the Success Rate of Equipment Reliability Test", the confidence level is 0.9 or 0.95, and the reliability requirement is higher than 0.999 When testing 2303 rounds or 2996 rounds, this is unacceptable to the developer and tester, so it is urgent to find an evaluation method to reduce the sample
[0003] In recent years, there have been few researches on the reliability of the missile detector structure, and no specific comprehensive verification scheme for the reliability of the test samples has been proposed.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Design and evaluation method of a detector structure high overload tightening test
  • Design and evaluation method of a detector structure high overload tightening test
  • Design and evaluation method of a detector structure high overload tightening test

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0096] The present invention will be further described in detail below in conjunction with examples.

[0097] See figure 1 , a method for designing and evaluating a detector structure high overload tightening test of the present invention, which is realized through the following steps:

[0098] Step 1: Estimate the coefficient of variation

[0099] If the mean and variance of strength and stress are measured for 20 detector structures, it is assumed that the measured mean and variance are shown in the following table:

[0100] Table 2 Measured value of stress intensity

[0101] category

Average (×1000g)

Standard deviation (×1000g)

Coefficient of variation

sample size

stress

30

4.5

0.15

10

strength

50

5.0

0.1

10

[0102] Step 2: Calculate the test sample size under the condition of constant tightening

[0103] If 1-α=0.9, the reliability index is required to reach R L =0.999, calculate formula (11), obtain...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A design and evaluation method for a high-overload tightening test of a detector structure, which has five major steps: Step 1: Definition of tightening coefficient, variation coefficient, and survival coefficient; Step 2: Determination of the above-mentioned coefficients; Step 3: Establishment of static Stress-strength interference model; Step 4: Calculate the test sample size under constant tightening conditions; Step 5: Calculate the test sample size under variable tightening conditions. The principle and calculation process of the invention are simple and easy to understand, easy to realize engineering application, and have great economic value and broad application prospects in the technical field of structural reliability of bomb detectors.

Description

technical field [0001] The invention relates to a design and evaluation method for a high overload tightening test of a detector structure, which is aimed at a certain type of bomb detector structure whose strength characteristic parameters of detector products obey a normal distribution, based on the "stress-strength" interference model, research A reliability statistical verification scheme of the high overload stress test is established. The success-or-failure test of the detector structure is carried out in a harsher environment than the actual conditions, aiming to solve the problem that the general success-or-failure statistical method cannot be used to evaluate its reliability in the case of small samples. The invention belongs to the technical field of structural reliability of bomb detectors. Background technique [0002] The present invention is mainly aimed at the bomb detector structure, which plays an irreplaceable role in long-range strike and accurate strike ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F19/00
Inventor 马小兵章健淳贾一桢
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com