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Test instrument, system and method

A test instrument and test interface technology, applied in transmission systems, digital transmission systems, electrical components, etc., can solve the problem that the test instrument cannot perform multiple tests, and achieve the effects of convenient data viewing, excellent timing performance, and simple structure

Inactive Publication Date: 2015-11-18
OPWILL TECH BEIJING
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The main problem solved by this application is to provide a test instrument, system and method to solve the technical problem that one test instrument cannot perform multiple tests

Method used

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  • Test instrument, system and method
  • Test instrument, system and method
  • Test instrument, system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0075] Such as figure 1 As shown, the present invention provides a test instrument, and the test instrument includes: a test interface unit 1, a test unit 2, a display unit 3, a test control unit 4, a wireless connection unit 5, a clock control unit 6 and a storage unit 7, in,

[0076] The test interface unit 1 is used to send test signals or receive test signals sent by other devices;

[0077] The test unit 2 is used to receive the test data from the test interface unit 1 and transfer the test data to the display unit 3 after processing;

[0078] The display unit 3 is configured to accept and display the data sent by the test unit 2;

[0079] The test control unit 4 is configured to control the test unit 2 to load a clock test program, an Ethernet test program or a 2M test program from the storage unit 7;

[0080] The wireless connection unit 5 is used to send test data to a remote intelligent terminal;

[0081] The clock control unit 6 is used to provide accurate time an...

Embodiment 2

[0085] The present invention provides a test instrument, which includes: a test interface unit 1, a test unit 2, a display unit 3, a test control unit 4, a wireless connection unit 5, a clock control unit 6 and a storage unit 7, wherein,

[0086] The test interface unit 1 is used to send test signals or receive test signals sent by other devices;

[0087] The test unit 2 is used to receive the test data from the test interface unit 1 and transfer the test data to the display unit 3 after processing;

[0088] The display unit 3 is configured to accept and display the data sent by the test unit 2;

[0089] The test control unit 4 is configured to control the test unit 2 to load a clock test program, an Ethernet test program or a 2M test program from the storage unit 7;

[0090] The wireless connection unit 5 is used to send test data to the remote intelligent terminal 10;

[0091] The clock control unit 6 is used to provide accurate time and clock for the system;

[0092] The...

Embodiment 3

[0097] The present invention provides a test instrument, which includes: a test interface unit 1, a test unit 2, a display unit 3, a test control unit 4, a wireless connection unit 5, a clock control unit 6 and a storage unit 7, wherein,

[0098] The test interface unit 1 is used to send test signals or receive test signals sent by other devices;

[0099] The test unit 2 is used to receive the test data from the test interface unit 1 and transfer the test data to the display unit 3 after processing;

[0100] The display unit 3 is configured to accept and display the data sent by the test unit 2;

[0101] The test control unit 4 is configured to control the test unit 2 to load a clock test program, an Ethernet test program or a 2M test program from the storage unit 7;

[0102] The wireless connection unit 5 is used to send test data to the remote intelligent terminal 10;

[0103] The clock control unit 6 is used to provide accurate time and clock for the system;

[0104] The...

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PUM

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Abstract

The application discloses a test instrument. The test instrument is characterized by including a test interface unit, a test unit, a display unit, a test control unit, a wireless connection unit, a clock control unit and a storage unit. The test interface unit is used for sending a test signal or receiving test signals sent from other devices. The test unit is used for receiving test data transmitted from the test interface unit and transferring the test data to the display unit after processing the test data. The display unit is used for receiving and displaying the data sent from the test unit. The test control unit is used for controlling the test unit to load a clock test program, an Ethernet test program or a 2M test program from the storage unit. The invention also provides a test method. The beneficial effects of the invention are as follows: the test instrument is high in integration, can test time and a clock, also can test the Ethernet and 2M services, is convenient to carry, and is reduced in maintenance cost.

Description

technical field [0001] The invention belongs to the field of communication testing, and further relates to a testing instrument, system and method. Background technique [0002] With the rapid development of my country's PTN and IPRAN network construction, in order to check whether the data transmission is complete and correct in the process of program execution, various data transmission measuring instruments have emerged. Taking the network tester as an example, with the popularization of the network and With the complexity, the reasonable erection and normal operation of the network has become extremely important, and to ensure the normal operation of the network must start from two aspects. First, the quality of network construction directly affects the subsequent use of the network, so the construction quality cannot be ignored, and must be strictly required and checked carefully to prevent problems before they happen. Second, the troubleshooting of network faults is ve...

Claims

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Application Information

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IPC IPC(8): H04L12/26
Inventor 朱天全鲍胜青陈立仓
Owner OPWILL TECH BEIJING
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