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A drc verification method for parameterized units in a process development kit

A technology of parameterized units and verification methods, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as PCellDRC errors, insufficient verification, and insufficient coverage

Active Publication Date: 2019-09-03
SEMICON TECH INNOVATION CENT(BEIJING) CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The commonly used verification method in the prior art is to randomly select values ​​of PCell parameters within the design range according to experience. The number of instances is on the order of hundreds, and the insufficient coverage leads to insufficient verification. Found that PCell has DRC errors

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  • A drc verification method for parameterized units in a process development kit

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Embodiment Construction

[0046] In the following description, numerous specific details are given in order to provide a more thorough understanding of the present invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced without one or more of these details. In other examples, some technical features known in the art are not described in order to avoid confusion with the present invention.

[0047] It should be noted that the terms used herein are for the purpose of describing specific embodiments only, and are not intended to limit exemplary embodiments according to the present invention. As used herein, singular forms are intended to include plural forms unless the context clearly dictates otherwise. In addition, it should also be understood that when the terms "comprising" and / or "comprising" are used in this specification, it indicates the presence of the features, integers, steps, operations, elements and / or components, but does not exclude th...

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Abstract

The invention relates to a DRC verifying method for a parameterized unit in a software development kit. The method comprises the following steps of (a) producing a PCell instance, (b), laying out the PCell instance and (c), executing DRC check to check whether PCell parameters in the PCell instance is wrong or not. The DRC verifying method is provided to produce large PCell instances in a quick and effective way and conduct DRC verification to PCell instances in a high efficient and full-around way in conditions of limited developing time and limited calculation resources. When DRC error exists in the produced PCell instances, the related parameter of the PCell instance having wrong DRC can be quickly and accurately positioned, so developers can find the DRC error reasons and modify the PCell.

Description

technical field [0001] The invention relates to the field of semiconductors, and in particular, the invention relates to a DRC verification method for a parameterized unit in a process development kit. Background technique [0002] With the continuous development of integrated circuit technology, more devices will be integrated on the chip, and the chip will adopt faster speed. Driven by these requirements, the geometric size of devices will continue to shrink, and new materials, new technologies and new manufacturing processes will be continuously used in the chip manufacturing process. These improvements have a great impact on the life of a single device, which may result in increased vulnerability of local areas, increased power density, increased device complexity, and the introduction of new failure mechanisms. It is considered from the beginning, and is monitored and tested during the development and manufacturing of the device, all the way to the completion of the fi...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50
Inventor 李滔生俊扬王春辉牛欢欢高颖
Owner SEMICON TECH INNOVATION CENT(BEIJING) CORP