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Insulation inspection apparatus and insulation inspection method

A detection device and detection point technology, applied in the direction of measuring device, measuring circuit, test circuit, etc., can solve the problems of inability to properly detect voltage drop, inability to properly detect electric spark, etc., and achieve the effect of good detection and good voltage drop

Active Publication Date: 2015-11-25
NIDEC-READ CORPORATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] However, when performing the detection described in Patent Document 1, if a large current is also uniformly flowed to any pair of wiring patterns extracted from a plurality of wiring patterns, there is a problem that the voltage drop cannot be properly detected, and thus cannot be properly detected. ground detection of electric sparks

Method used

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  • Insulation inspection apparatus and insulation inspection method
  • Insulation inspection apparatus and insulation inspection method
  • Insulation inspection apparatus and insulation inspection method

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Embodiment Construction

[0035] Hereinafter, embodiments of the present invention will be described based on the drawings.

[0036]

[0037] figure 1 It is a schematic configuration diagram showing a schematic configuration of the insulation detection device 1 .

[0038] The insulation testing device 1 is an insulation testing device that performs insulation testing between a plurality of wiring patterns formed on a substrate to be tested (circuit board). The substrate to be inspected may be, for example, various substrates such as printed wiring boards, flexible substrates, multilayer wiring boards, and packaging substrates for semiconductor packaging.

[0039] Such as figure 1 As shown, the insulation detection device 1 includes a power supply 2 , a voltmeter 3 , an ammeter 5 , a control unit 7 and a memory unit 8 .

[0040] The power supply 2 applies a high voltage (for example, 200 V) to each other of insulation detection target wiring patterns (insulation detection target wiring patterns) se...

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Abstract

An insulation inspection technique for allowing the occurrence of sparks to be detected more satisfactorily and allowing a board in which sparks have occurred to be more satisfactorily detected as being detective is provided. An insulation inspection apparatus detects a voltage induced between insulation inspection target wiring patterns by the application of a voltage during a time period from the start of the voltage application between the insulation inspection target wiring patterns to a predetermined time when the voltage between the insulation inspection target wiring patterns has stabilized. When a voltage drop due to sparks occurring between the insulation inspection target wiring patterns is detected during the time period, the board to be inspected is determined to be defective (steps S17, S18). In particular, supply current during the time period is set in accordance with the number of inspection points of an upstream wiring pattern (high-potential wiring pattern) of the insulation inspection target wiring patterns (step S11).

Description

technical field [0001] The invention relates to an insulation detection device for performing insulation detection between wiring patterns formed on a substrate to be detected and related technologies. Background technique [0002] In a substrate (circuit substrate) having a plurality of wiring patterns, whether the substrate is good or not is determined by judging whether the insulation state between a pair of wiring patterns sequentially selected from the plurality of wiring patterns is good or not. insulation testing. [0003] Specifically, after starting to apply a voltage to a pair of wiring patterns, based on the voltage between the pair of wiring patterns at a predetermined time when the voltage becomes stable and the current flowing between the pair of wiring patterns at the predetermined time, calculate The mutual resistance value of the pair of wiring patterns, and based on the resistance value, the quality determination of the substrate to be inspected is perform...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/02H05K3/00
CPCG01R31/2805G01R31/14G01R31/1272G01R31/28
Inventor 笠井淳
Owner NIDEC-READ CORPORATION