Implantable medical device with multiple memory access modes

Abstract

The present invention relates to an implantable medical facility with a plurality of memorizer access modes including a control unit. The control unit can be coupled to a central processing unit in an operability mode, and is configured to control the central processing unit to access a memorizer in the following modes: 1) a first mode, wherein, the control unit allows the central processing unit to normally operate and fully controls the access to the memorizer; 2) a second mode, wherein, the control unit allows the central processing unit to normally operate including the access to the memorizer, but the control unit races to control the access to the memorizer when the central processing unit does not access the memorizer; 3) a third mode, wherein, the control unit allows the central processing unit to access the memorizer, but the control unit controls the operation of the central processing unit; and 4) a fourth mode, wherein, the control unit races to control the access to the memorizer, and prevents the central processing unit from accessing the memorizer.

Description

technical field [0001] The present invention relates generally to implantable medical devices and systems, and more particularly to implantable medical devices that control memory access. Background technique [0002] Most implantable medical devices are complex electronic devices that often include a microprocessor for controlling operation. The microprocessor is typically coupled with at least one memory or storage unit to store and retrieve data and information related to the operation of the implantable medical device. During the development of new or improved implantable medical devices, or during manufacture or post-manufacturing, it is often desirable to be able to detect memory operations while the implantable medical device is running and during different operations of the device. However, when the implantable medical device is running, competing requests for access to the memory of the running implantable medical device necessarily limit the ability to observe and...

AI Technical Summary

Problems solved by technology

However, when the implantable medical device is running, competing requests for access to the memory of the running implantable medical device necessarily limit the ability to observe and test memory operations

Although often the memory itself is self-testing, it is difficult to see and understand the operation of the memory while it is being used during operation of the implantable medical device

Since memory development or production bugs or errors in memory may only occur when the implantable medical device is actually in operation, it may be difficult to detect and correct these faults or errors quickly and easily

Normal operation of implantable medical devices may prevent the ability to adequately test and debug memory

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