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Micro-switch service life test device

A technology of life test device and micro switch, which is applied in the field of test and detection, can solve the problems that the working temperature cannot meet the requirements of use, there is no test institution or research institute, and the temperature cannot exceed -65 °C, and the mechanical transmission link, power consumption, etc. can be reduced. The effect of low consumption and reliable action

Active Publication Date: 2015-12-09
GUIZHOU ZHENHUA HUALIAN ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the domestic test schemes use the scheme of motor-driven cam mechanism as the micro switch life test device, but this kind of test device has many transmission links, and the lowest test temperature cannot exceed -65°C, and the temperature below -65°C will be affected by the action of the device deadlocked and not working
[0003] With the continuous expansion of the application field of micro switches, the ambient working temperature of -65°C can no longer meet the requirements of use. The company undertook a research and development project of micro switches, which required the working temperature to be The life test device can work normally under high temperature, so there is no testing institution or research institute in China that can carry out this test

Method used

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Embodiment Construction

[0015] The technical solution of the present invention is further described below, but the scope of protection is not limited to the description.

[0016] Such as Figure 1 ~ Figure 3 A micro switch life test device shown includes a test switch 1, a switch mounting plate 2, a seat body 3, a fixed electromagnet assembly 4, a cover plate 5 and a moving electromagnet assembly 6; the test switch 1 is respectively installed on The lower ends of the left and right switch mounting plates 2, the upper ends of the left and right switch mounting plates 2 are respectively fixedly connected with the corresponding lower ends of the seat body 3, and the upper ends of the seat body 3 are fixedly connected with the fixed electromagnet assembly 4; the moving electromagnet assembly 6 It consists of a moving electromagnet 61 and a swing rod 64 fixedly installed on the connecting block 63, and the moving electromagnet assembly 6 is movably installed between the seat body 3 and the cover plate 5 t...

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Abstract

The invention provides a micro-switch service life test device. Test switches are respectively arranged on the lower ends of left and right switch mounting plates. The upper ends of left and right switch mounting plates are respectively fixedly connected with the corresponding lower end of a base body. The upper end of the base body is fixedly connected with a fixed electromagnet assembly. A movable electromagnet and a pendulum are fixedly arranged on a connection block to form a movable electromagnet assembly. The movable electromagnet assembly is movably arranged between the base body and a cover plate through a stepped shaft which is fixedly arranged on the pendulum. According to the invention, magnetic force produced by the electromagnet is used to drive a mechanism to operate; the most simplified structure design is used; mechanical transmission links are minimized; the mechanism is prevented from locking at low temperature; the test device can reliably operate at the temperature from minus 196 DEG C to minus 184 DEG C; a 24V DC power supply is used for driving the device; the running current is between 2 and 3A; and the device has the advantages of high safety factor and low power consumption.

Description

technical field [0001] The invention relates to the technical field of test and detection, in particular to a micro switch life test device. Background technique [0002] Test is a routine way to verify the performance, function and reliability of micro switch products; among them, mechanical life test and electrical life test are a key test items for micro switches, and life test is to put the switch in the environmental test chamber Inside, under the specified temperature environment, use the test device to drive the micro switch to repeatedly operate for the specified number of times, and test the switch during the test and after the test is completed. At present, the domestic test schemes use the scheme of motor-driven cam mechanism as the micro switch life test device, but this kind of test device has many transmission links, and the lowest test temperature cannot exceed -65°C, and the temperature below -65°C will be affected by the action of the device Locked and not ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/327
Inventor 江锦杨琎代明德何燕
Owner GUIZHOU ZHENHUA HUALIAN ELECTRONICS