A micro switch life test device
A technology of life test device and micro switch, which is applied in the field of test and detection, can solve the problems that the working temperature cannot meet the use requirements, there is no test institution or research institute, and the temperature cannot exceed -65°C, so as to reduce the mechanical transmission links and work The effect of low power consumption and reliable operation
Active Publication Date: 2017-12-22
GUIZHOU ZHENHUA HUALIAN ELECTRONICS
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Problems solved by technology
At present, the domestic test schemes use the scheme of motor-driven cam mechanism as the micro switch life test device, but this kind of test device has many transmission links, and the lowest test temperature cannot exceed -65°C, and the temperature below -65°C will be affected by the action of the device deadlocked and not working
[0003] With the continuous expansion of the application field of micro switches, the ambient working temperature of -65°C can no longer meet the requirements of use. The company undertook a research and development project of micro switches, which required the working temperature to be The life test device can work normally under high temperature, so there is no testing institution or research institute in China that can carry out this test
Method used
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[0015] The technical solution of the present invention is further described below, but the scope of protection is not limited to the above.
[0016] Such as Figure 1 ~ Figure 3 The life test device for a micro switch shown includes a test switch 1, a switch mounting plate 2, a seat body 3, a fixed electromagnet assembly 4, a cover plate 5 and a movable electromagnet assembly 6; the test switches 1 are respectively installed on The lower ends of the left and right switch mounting plates 2, the upper ends of the left and right switch mounting plates 2 are respectively fixedly connected to the corresponding lower ends of the base body 3, and the upper end of the base body 3 is fixedly connected to the fixed electromagnet assembly 4; the moving electromagnet assembly 6 The moving electromagnet 61 and the swing rod 64 are fixedly installed on the connecting block 63, and the moving electromagnet assembly 6 is movably installed between the base body 3 and the cover plate 5 through a s...
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The invention provides a micro switch life test device, the test switches are respectively installed on the lower ends of the left and right switch mounting plates, the upper ends of the left and right switch mounting plates are respectively fixedly connected with the corresponding lower ends of the seat body, and the upper ends of the seat body It is fixedly connected with the fixed electromagnet assembly; the moving electromagnet assembly is composed of a moving electromagnet and a swing rod fixedly installed on the connecting block, and the moving electromagnet assembly is movably installed on the base through a stepped shaft fixed on the swing rod and between the cover. The invention uses the magnetic force generated by the electromagnet to drive the mechanism, adopts the most simplified structural design, minimizes the mechanical transmission links, and avoids the mechanism from locking up at low temperatures. Action: driven by 24V DC power supply, operating current 2-3A, high safety factor, low power consumption.
Description
Technical field [0001] The invention relates to the technical field of test detection, in particular to a life test device for a micro switch. Background technique [0002] The test is a conventional way to verify the performance, function and reliability of the micro switch product; the mechanical life test and the electrical life test are a key test item for the micro switch, and the life test is to place the switch in an environmental test box Inside, under the specified temperature environment, use the test device to drive the micro switch repeatedly to reach the specified number of times, and test the switch during and after the test. At present, the domestic test schemes adopt the scheme of motor-driven cam mechanism as the life test device of micro switch. However, this type of test device has many transmission links. The minimum test temperature cannot exceed -65℃, and it will be caused by the action of the device when it is lower than -65℃. Locked to death and unable to...
Claims
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IPC IPC(8): G01R31/327
Inventor 江锦杨琎代明德何燕
Owner GUIZHOU ZHENHUA HUALIAN ELECTRONICS