CEEMD (Complementary Empirical Mode Decomposition)-STFT (Short-Time Fourier Transform) time-frequency information entropy and multi-SVM (Support Vector Machine) based fault diagnosis method for centrifugal pump
A fault diagnosis and information entropy technology, applied in pump control, non-variable pumps, machines/engines, etc., can solve problems such as non-stationary, poor repeatability, and large amount of vibration signal information of centrifugal pumps, and achieve diagnosis High precision, suppression of modal aliasing, and good robustness
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0026] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.
[0027] 1. Introduction to the embodiment of the centrifugal pump fault diagnosis method based on CEEMD-STFT time-frequency information entropy and multi-SVM
[0028] 1.1 The flow of centrifugal pump fault diagnosis method based on CEEMD-STFT time-frequency information entropy and multi-SVM
[0029] The fault diagnosis process proposed by this method is as follows: figure 1 As shown, there are five main parts including data preprocessing, feature extraction, dimension reduction and pattern recognition, as follows:
[0030] The first step is data preprocessing. In order to improve the quality and efficiency of subsequent data processing, abnormal data in the original data were removed and normalized.
[0031] The second step is fault feature extraction. First, use the CEEMD decomposition method to adaptively decompose the preprocessed signal ...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com
