Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Polarization axis detector, polarization measurement device and method, and polarized light irradiation device

A technology for measuring devices and polarized light, which is applied in measuring devices, reflectometers for processing polarization, and measuring the polarization of light, and can solve the problems of low accuracy in measuring polarization axes

Active Publication Date: 2016-02-03
USHIO DENKI KK
View PDF5 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the technology described in the above-mentioned Patent Document 1, since fluctuations in the arc of the discharge lamp are not considered, the measurement accuracy of the polarization axis of polarized light is low.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Polarization axis detector, polarization measurement device and method, and polarized light irradiation device
  • Polarization axis detector, polarization measurement device and method, and polarized light irradiation device
  • Polarization axis detector, polarization measurement device and method, and polarized light irradiation device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] Hereinafter, embodiments of the present invention will be described based on the drawings.

[0041] figure 1 It is a schematic configuration diagram showing the polarized light irradiation device of this embodiment.

[0042] The polarized light irradiation device 100 includes light irradiation sections 10A and 10B, and a conveying section 20 that conveys a workpiece W. Here, the workpiece W is a rectangular substrate formed with a photo-alignment film, for example, processed into the size of a liquid crystal panel.

[0043] The polarized light irradiation device 100 irradiates polarized light (polarized light) of a predetermined wavelength from the light irradiation sections 10A and 10B, and at the same time moves the workpiece W linearly by the conveying section 20, and irradiates the above-mentioned polarized light to the light alignment film of the workpiece W. Orientation processing.

[0044] The light irradiation sections 10A and 10B each include a discharge lamp 11 as a ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention provides a polarization axis detector, a polarization measurement device and method, and a polarized light irradiation device. The light from a light source changes with the illuminance of time, the polarization axis of the polarized light may be measured with a high precision. The polarization axis detector comprises a first polarized light detection part (311) having a rotary detection polarizer (311a) configured to detect the polarization axis and a first illuminance sensor (311b) configured to detect the illuminance information of the polarized light from the light source through the detection polarizer (311a); and a second polarized light detection part (312) arranged in parallel with the first polarized light detection part (311) and having a second illuminance sensor (312a) configured to directly detection the illuminance information of the polarized light from the light source. The polarization measurement device is configured to calculate the polarization property of the polarized light from the light source according to the illuminance information detected by the first polarized light detection part (311) and the illuminance information detected by the second polarized light detection part (312).

Description

Technical field [0001] The present invention relates to a polarization axis detector for measuring the polarization axis of polarized light, a polarization measurement device, a polarization measurement method, and a polarization irradiation device. Background technique [0002] In recent years, with regard to the alignment treatment of the alignment film of the liquid crystal display element represented by the liquid crystal panel or the alignment layer of the viewing angle compensation film, a technique called photo-alignment in which a predetermined wavelength of polarized light is irradiated for alignment has been adopted. [0003] The irradiating device used in the light orientation usually includes a light source and a polarizer, passes the light from the light source through the polarizer, and irradiates the polarized light obtained therefrom. In the photo-alignment technology, it is very important whether the polarization axis of the polarized light irradiated from the irra...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J4/04G01N21/21G01N21/01
CPCG01J4/04G01M11/3181
Inventor 吉田启二
Owner USHIO DENKI KK
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com