Polarization axis detector, polarization measurement device and method, and polarized light irradiation device
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- USHIO DENKI KK
- Publication Date
- 2016-02-03
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Abstract
Description
Technical field
[0001] The present invention relates to a polarization axis detector for measuring the polarization axis of polarized light, a polarization measurement device, a polarization measurement method, and a polarization irradiation device. Background technique
[0002] In recent years, with regard to the alignment treatment of the alignment film of the liquid crystal display element represented by the liquid crystal panel or the alignment layer of the viewing angle compensation film, a technique called photo-alignment in which a predetermined wavelength of polarized light is irradiated for alignment has been adopted.
[0003] The irradiating device used in the light orientation usually includes a light source and a polarizer, passes the light from the light source through the polarizer, and irradiates the polarized light obtained therefrom. In the photo-alignment technology, it is very important whether the polarization axis of the polarized light irradiated from the irra...