Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

An online detection device for accelerated life of LED lamps

A technology of LED lamps and accelerated life, applied in the direction of testing optical performance, etc., can solve the problems of cumbersome test process, off-line test, long test time, etc., to achieve scientific and effective service life, reduce errors, and shorten accelerated life test time. Effect

Inactive Publication Date: 2018-06-26
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention proposes an online testing system for accelerated life of LED lighting fixtures to solve the problems of the existing accelerated life testing equipment for LED lighting fixtures, such as too cumbersome testing process, too long testing time, off-line testing, etc.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • An online detection device for accelerated life of LED lamps
  • An online detection device for accelerated life of LED lamps
  • An online detection device for accelerated life of LED lamps

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] The present invention will be described in further detail below in conjunction with the embodiment given with accompanying drawing.

[0019] Such as figure 1 As shown, an online testing device for accelerated life of LED lighting lamps, mainly including a test box 1, a lamp fixture device 2, an external integrating sphere system 3, a control host 4 and a computer 5;

[0020] Such as figure 2 As shown, the test box 1 includes an optical measurement channel 1-1 and a temperature application unit 1-2. The optical measurement channel 1-1 is located at the connection between the test box 1 and the external integrating sphere system 3, which is a vacuumized double-layer glass tube structure, and plays a role in isolating the temperature of the test box 1 and the external integrating sphere system 3. The temperature application unit 1-2 is arranged on the inner wall of the test box 1, and the temperature of the test box 1 is controlled by heating. The box is not limited to ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

An accelerated life online testing device for LED lighting lamps belongs to the field of reliability testing of semiconductor devices. In order to solve the problems in the prior art, a test box includes an optical measurement channel and a temperature application unit, and the optical measurement channel is located in the test box. The connection point with the external integrating sphere system; the lamp fixture device, which is set in the test box, which is a positive and negative 360° rotatable multi-position independent lamp stand, and the tested LED lamp sample is installed on the lamp fixture device; the external integrating sphere The system, which is closely connected with the test box without light leakage, and the temperature-insulating and evacuated double-layer glass tube is placed inside the external integrating sphere system; the control host, which is respectively connected with the test box, the external integrating sphere system and the computer through data lines , used to control the acceleration temperature setting of the test box and the test parameter setting of the external integrating sphere; the computer is used to display the online data of the control host in real time; the device can quickly display the performance of LED lighting products.

Description

technical field [0001] The invention belongs to the field of reliability detection of semiconductor devices, and in particular relates to a life-span acceleration test device for LED lighting lamps. Background technique [0002] With the improvement of LED light source light efficiency, color rendering, luminous output of a single module and the reduction of price, LED technology is gradually entering the field of general lighting applications. However, if LED lighting fixtures are to completely replace incandescent lamps and fully enter the general lighting market, people still lack sufficient confidence. The reason is that people still have certain doubts about the quality of LED lighting fixtures. As we all know, LED lighting products are long-life semiconductor devices. The traditional non-accelerated aging test (US Energy Star recommends 6000 hours) is no longer suitable for testing current LED lighting fixtures. How to quickly and scientifically evaluate the The lifes...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
CPCG01M11/02
Inventor 孙强荆雷续志军郝剑客洪亮
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products