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LED-lamp accelerated-life on-line detection equipment

A technology of LED lamps and accelerated life, applied in the direction of testing optical performance, etc., can solve the problems of off-line test, long test time, cumbersome test process, etc., to reduce errors, scientific and effective service life, and shorten the accelerated life test time. Effect

Inactive Publication Date: 2016-03-30
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention proposes an online testing system for accelerated life of LED lighting fixtures to solve the problems of the existing accelerated life testing equipment for LED lighting fixtures, such as too cumbersome testing process, too long testing time, off-line testing, etc.

Method used

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  • LED-lamp accelerated-life on-line detection equipment
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Embodiment Construction

[0018] The present invention will be described in further detail below in conjunction with the embodiment given with accompanying drawing.

[0019] Such as figure 1 As shown, an online testing device for accelerated life of LED lighting lamps, mainly including a test box 1, a lamp fixture device 2, an external integrating sphere system 3, a control host 4 and a computer 5;

[0020] Such as figure 2 As shown, the test box 1 includes an optical measurement channel 1-1 and a temperature application unit 1-2. The optical measurement channel 1-1 is located at the connection between the test box 1 and the external integrating sphere system 3, which is a vacuumized double-layer glass tube structure, and plays a role in isolating the temperature of the test box 1 and the external integrating sphere system 3. The temperature application unit 1-2 is arranged on the inner wall of the test box 1, and the temperature of the test box 1 is controlled by heating. The box is not limited to ...

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Abstract

LED-lamp accelerated-life on-line detection equipment belongs to the reliability detection field of a semiconductor device. In order to solve a problem in the prior art, the invention provides the equipment. The equipment comprises a test box body, a lamp clamp apparatus, an external connection integrating sphere system, a control host and a computer, wherein the test box body comprises an optical measurement channel and a temperature applying unit; the optical measurement channel is located at a connection position of the test box body and the external connection integrating sphere system; the lamp clamp apparatus is arranged in the test box body and is a positive-negative 360-degree rotary type multi-station independent lamp bracket; a detected LED lamp sample is installed on the lamp clamp apparatus; the external connection integrating sphere system is tightly connected to the test box body and there is no light leakage, and a thermal-insulation vacuum-pumping double-layer glass tube is arranged in the external connection integrating sphere system; the control host is connected to the test box body, the external connection integrating sphere system and the computer through a data line respectively and is used for controlling setting of an acceleration temperature of the test box body and setting of a test parameter of an external connection integrating sphere; and the computer is used for displaying on-line data of the control host in real time. By using the equipment, performance of a LED lamp product can be rapidly shown.

Description

technical field [0001] The invention belongs to the field of reliability detection of semiconductor devices, and in particular relates to a life-span acceleration test device for LED lighting lamps. Background technique [0002] With the improvement of LED light source light efficiency, color rendering, luminous output of a single module and the reduction of price, LED technology is gradually entering the field of general lighting applications. However, if LED lighting fixtures are to completely replace incandescent lamps and fully enter the general lighting market, people still lack sufficient confidence. The reason is that people still have certain doubts about the quality of LED lighting fixtures. As we all know, LED lighting products are long-life semiconductor devices. The traditional non-accelerated aging test (US Energy Star recommends 6000 hours) is no longer suitable for testing current LED lighting fixtures. How to quickly and scientifically evaluate the The lifes...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/02
Inventor 孙强荆雷续志军郝剑客洪亮
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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